IEEE Transactions on Reliability - 巻 73 / 号 1
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|---|---|---|---|---|---|---|---|---|---|
| 著者 | 巻 | 号 | ページ | 年 | PKV | ||||
| Joint Instance and Feature Adaptation for Heterogeneous Defect Prediction | |||||||||
| Yujie Ren, Bin Liu, Shihai Wang | 73 | 1 | 741–756 | 2024 | 1.0 | ||||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| An Empirical Study on Android Malware Characterization by Social Network Analysis | |||||||||
| Haojun Zhao, Yueming Wu, Deqing Zou, Hai Jin | 73 | 1 | 757–770 | 2024 | 0.0 | ||||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| Single Event Effects Assessment of UltraScale+ MPSoC Systems Under Atmospheric Radiation | |||||||||
| Dimitris Agiakatsikas, Nikos Foutris, Aitzan Sari, Vasileios Vlagkoulis, Ioanna Souvatzoglou, Mihalis Psarakis, Ruiqi Ye, John Goodacre, Mikel Luján, Maria Kastriotou, Carlo Cazzaniga, Chris Frost | 73 | 1 | 771–783 | 2024 | 2.0 | ||||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| Elimination of Die-Pop Defect by Vacuum Reflow for Ultrathin Die With Warpage in Semiconductor Packaging Assembly | |||||||||
| Siang Miang Yeo, Ho Kwang Yow, Keat Hoe Yeoh, Siti Nur Farhana Mohamad Azenal | 73 | 1 | 784–791 | 2024 | 1.0 | ||||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| MSiT: A Cross-Machine Fault Diagnosis Model for Machine-Level CNC Spindle Motors | |||||||||
| Yiming He, Weiming Shen | 73 | 1 | 792–802 | 2024 | 1.0 | ||||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||