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IEEE Transactions on Reliability - 巻 71 / 号 4

タイトル
著者 巻 号 ページ 年 PKV
Editorial Emerging Trends in Trustworthy Computing
Winston Shieh 71 4 1399–1400 2022 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
DeepRepair: Style-Guided Repairing for Deep Neural Networks in the Real-World Operational Environment
Bing Yu, Hua Qi, Qing Guo, Felix Juefei-Xu, Xiaofei Xie, Lei Ma, Jianjun Zhao 71 4 1401–1416 2022 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Measuring Conflicts of Multisource Imprecise Information in Multistate System Reliability Assessment
Tangfan Xiahou, Zhiguo Zeng, Yu Liu, Hong-Zhong Huang 71 4 1417–1434 2022 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Toward Reliable UAV-Enabled Positioning in Mountainous Environments: System Design and Preliminary Results
Zijie Wang, Rongke Liu, Qirui Liu, Lincong Han, John S. Thompson, Yun Lin, Weiqing Mu 71 4 1435–1463 2022 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Generic Framework for Integration of First Prediction Time Detection With Machine Degradation Modelling from Frequency Domain
Tongtong Yan, Dong Wang, Bingchang Hou, Zhike Peng 71 4 1464–1476 2022 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
A Revisit of Age-Based Replacement Models With Exponential Failure Distributions
Xufeng Zhao, Butong Li, Satoshi Mizutani, Toshio Nakagawa 71 4 1477–1487 2022 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Replacement and Repair Optimization for Production Systems Under Random Production Waits
Jiawen Hu, Qiuzhuang Sun, Zhi-Sheng Ye 71 4 1488–1500 2022 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Hybrid Discrete Differential Evolution and Deep Q-Network for Multimission Selective Maintenance
Yue Xu, Dechang Pi, Zhiyuan Wu, Junfu Chen, Enrico Zio 71 4 1501–1512 2022 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
A Privacy Risk Assessment Scheme for Fog Nodes in Access Control System
Changbo Ke, Jiayu Wu, Fu Xiao, Zhiqiu Huang, Yunfei Meng 71 4 1513–1526 2022 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
SNIFF: Reverse Engineering of Neural Networks With Fault Attacks
Jakub Breier, Dirmanto Jap, Xiaolu Hou, Shivam Bhasin, Yang Liu 71 4 1527–1539 2022 0.0
平均評価: 0.0 / 5 (0 件のレビュー)