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IEEE Transactions on Reliability - 巻 71 / 号 4
タイトル
著者
巻
号
ページ
年
PKV
Editorial Emerging Trends in Trustworthy Computing
Winston Shieh
71
4
1399–1400
2022
0.0
平均評価: 0.0 / 5
(0 件のレビュー)
DeepRepair: Style-Guided Repairing for Deep Neural Networks in the Real-World Operational Environment
Bing Yu, Hua Qi, Qing Guo, Felix Juefei-Xu, Xiaofei Xie, Lei Ma, Jianjun Zhao
71
4
1401–1416
2022
0.0
平均評価: 0.0 / 5
(0 件のレビュー)
Measuring Conflicts of Multisource Imprecise Information in Multistate System Reliability Assessment
Tangfan Xiahou, Zhiguo Zeng, Yu Liu, Hong-Zhong Huang
71
4
1417–1434
2022
0.0
平均評価: 0.0 / 5
(0 件のレビュー)
Toward Reliable UAV-Enabled Positioning in Mountainous Environments: System Design and Preliminary Results
Zijie Wang, Rongke Liu, Qirui Liu, Lincong Han, John S. Thompson, Yun Lin, Weiqing Mu
71
4
1435–1463
2022
0.0
平均評価: 0.0 / 5
(0 件のレビュー)
Generic Framework for Integration of First Prediction Time Detection With Machine Degradation Modelling from Frequency Domain
Tongtong Yan, Dong Wang, Bingchang Hou, Zhike Peng
71
4
1464–1476
2022
0.0
平均評価: 0.0 / 5
(0 件のレビュー)
A Revisit of Age-Based Replacement Models With Exponential Failure Distributions
Xufeng Zhao, Butong Li, Satoshi Mizutani, Toshio Nakagawa
71
4
1477–1487
2022
0.0
平均評価: 0.0 / 5
(0 件のレビュー)
Replacement and Repair Optimization for Production Systems Under Random Production Waits
Jiawen Hu, Qiuzhuang Sun, Zhi-Sheng Ye
71
4
1488–1500
2022
0.0
平均評価: 0.0 / 5
(0 件のレビュー)
Hybrid Discrete Differential Evolution and Deep Q-Network for Multimission Selective Maintenance
Yue Xu, Dechang Pi, Zhiyuan Wu, Junfu Chen, Enrico Zio
71
4
1501–1512
2022
0.0
平均評価: 0.0 / 5
(0 件のレビュー)
A Privacy Risk Assessment Scheme for Fog Nodes in Access Control System
Changbo Ke, Jiayu Wu, Fu Xiao, Zhiqiu Huang, Yunfei Meng
71
4
1513–1526
2022
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
SNIFF: Reverse Engineering of Neural Networks With Fault Attacks
Jakub Breier, Dirmanto Jap, Xiaolu Hou, Shivam Bhasin, Yang Liu
71
4
1527–1539
2022
0.0
平均評価: 0.0 / 5
(0 件のレビュー)
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