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IEEE Transactions on Reliability - 巻 69 / 号 2

タイトル
著者	巻	号	ページ	年	PKV
Reliabilities of Some Multistate Consecutive-k Systems
He Yi, Lirong Cui, Hongda Gao	69	2	414–429	2020	1.0
平均評価: 0.0 / 5 (0 件のレビュー)
An Adjustable and Fast Error Repair Scrubbing Method Based on Xilinx Essential Bits Technology for SRAM-Based FPGA
Rongsheng Zhang, Liyi Xiao, Jie Li, Xuebing Cao, Linzhe Li	69	2	430–439	2020	1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Improved Decomposed-Coordinated Kriging Modeling Strategy for Dynamic Probabilistic Analysis of Multicomponent Structures
Cheng Lu, Yun-Wen Feng, Cheng-Wei Fei, Si-Qi Bu	69	2	440–457	2020	1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Color Degradation of Printed Images
Ziyi Wang, Elsayed A. Elsayed	69	2	458–470	2020	1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Extend GO Methodology to Support Common-Cause Failures Modeling Explicitly by Means of Bayesian Networks
Tianyuan Ye, Yuan Zhou, Anran Chen, Linlin Liu, Shouwen Liu	69	2	471–483	2020	0.0
平均評価: 0.0 / 5 (0 件のレビュー)
A Model-Ranking Approach for Estimation Based on Accelerated Degradation Test Data
Ling Li, Hon Keung Tony Ng, Ali H. Algarni, Abdullah M. Almarashi, Zaher A. Abo-Eleneen	69	2	484–496	2020	1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Algorithm for Solving Optimal Arrangement Problem in Connected-(r,s)-out-of-(m,n):F Lattice System
Taishin Nakamura, Hisashi Yamamoto	69	2	497–509	2020	0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Statistical Models of Overdispersed Spatial Defects for Predicting the Yield of Integrated Circuits
Tao Yuan, Suk Joo Bae, Yue Kuo	69	2	510–521	2020	1.0
平均評価: 0.0 / 5 (0 件のレビュー)
A New Study on Reliability Importance Analysis of Phased Mission Systems
Xianzhen Huang, Frank P. A. Coolen, Tahani Coolen-Maturi, Yimin Zhang	69	2	522–532	2020	1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Objective Comparison of Confidence Bound Methods for Binomial Series System Reliability
Edward Schuberg, Janet Myhre, Daniel R. Jeske, Allan D. McQuarrie, Joseph D. Warfield	69	2	533–544	2020	2.0
平均評価: 0.0 / 5 (0 件のレビュー)