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IEEE Transactions on Reliability - 巻 70 / 号 2

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著者 ページ PKV
Guest Editorial: Special Section on IEEE International Conference on Software Quality, Reliability, and Security (QRS) 2020
W. K. Chan, Mei Nagappan, Christof J. Budnik 70 2 442–442 2021 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Guest Editorial: A Retrospective of Special Sections on Software Testing and Program Analysis
T. H. Tse, Yves Le Traon, Zhenyu Chen 70 2 443–445 2021 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Two-Stage Maximum Likelihood Estimation Procedure for Parallel Constant-Stress Accelerated Degradation Tests
Cheng-Hsun Wu, Tzong-Ru Tsai, Ming-Yung Lee 70 2 446–458 2021 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Accelerated Life Test Planning for Minimizing Misclassification Risks
Liang Gao, Zhi-Sheng Ye, Wenhua Chen, Ping Qian, Jun Pan 70 2 459–471 2021 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Redundancy Dependence in the Context of Competing Risks and Dynamic Degradation
Tom Van Acker, Dirk Van Hertem 70 2 472–480 2021 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Hellinger Net: A Hybrid Imbalance Learning Model to Improve Software Defect Prediction
Tanujit Chakraborty, Ashis Kumar Chakraborty 70 2 481–494 2021 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
An Approach to Comparing Coherent Systems With Ordered Components by Using Survival Signatures
Weiyong Ding, Rui Fang, Peng Zhao 70 2 495–506 2021 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
On the Distribution Modeling of Heavy-Tailed Disk Failure Lifetime in Big Data Centers
Suayb S. Arslan, Engin Zeydan 70 2 507–524 2021 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Validation of a Link-Function Assumption in Type-II Censored Constant Stress Experiments
Thomas Seiche, Udo Kamps 70 2 525–534 2021 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
A Machine Learning Algorithm for Reliability Analysis
Maria Luz Gámiz, Fernando Jesus Navas-Gómez, Rocío Raya-Miranda 70 2 535–546 2021 1.0
平均評価: 0.0 / 5 (0 件のレビュー)