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IEEE Transactions on Reliability - 巻 66 / 号 4

タイトル
著者 巻 号 ページ 年 PKV
The Impact of Soft Error Event Topography on the Reliability of Computer Memories
Christopher Ogden, Michael Mascagni 66 4 966–979 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Optimization of Component Allocation/Distribution and Sequencing in Warm Standby Series-Parallel Systems
Gregory Levitin, Liudong Xing, Yuanshun Dai 66 4 980–988 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Accelerated Life Testing With Semiparametric Modeling of Stress Effects
Wujun Si, Qingyu Yang 66 4 989–996 2017 2.0
平均評価: 0.0 / 5 (0 件のレビュー)
Optimal Sequential ALT Plans for Systems With Mixture of One-Shot Units
Yao Cheng, Elsayed A. Elsayed 66 4 997–1011 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
The Song Rule as a Validator of Analytical Results—A Note Correcting System Reliability Results in a Review of the Literature
Wheyming Tina Song 66 4 1012–1024 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Reliability Assessment of Multiprocessor System Based on (n,k)-Star Network
Shuming Zhou, Xiaowang Li, Jinqiang Li, Dajin Wang 66 4 1025–1035 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Reliability Assessment of Hierarchical Systems With Incomplete Mixed Data
Rong Pan, Petek Yontay 66 4 1036–1047 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Machine Learning Model for Event-Based Prognostics in Gas Circulator Condition Monitoring
Jason J. A. Costello, Graeme M. West, Stephen D. J. McArthur 66 4 1048–1057 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Failure Mode and Effect Analysis Using Cloud Model Theory and PROMETHEE Method
Hu-Chen Liu, Zhaojun Li, Wenyan Song, Qiang Su 66 4 1058–1072 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
A Delay Time Model With Multiple Defect Types and Multiple Inspection Methods
Mohamad Mahmoudi, Alaa Elwany, Kamran Shahanaghi, Mohammad Reza Gholamian 66 4 1073–1084 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)