Paper list | KnowledgeRank: Top Science & Tech Papers

IEEE Transactions on Reliability - 巻 68 / 号 4

タイトル
著者	巻	号	ページ	年	PKV
Analytical and Evolutionary Methods for Finding Cut Volumes in Fault Trees Constrained by Location
Jeff Hanes, R. Paul Wiegand	68	4	1214–1226	2019	0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Reliability Assessment of Safety-Critical Sensor Information: Does One Need a Reference Truth?
Mario Berk, Olaf Schubert, Hans-Martin Kroll, Boris Buschardt, Daniel Straub	68	4	1227–1241	2019	0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Failure Mode and Effects Analysis Using Variable Precision Rough Set Theory and TODIM Method
Jing Li, Hong Fang, Wenyan Song	68	4	1242–1256	2019	0.0
平均評価: 0.0 / 5 (0 件のレビュー)
BLUEs and Reliability Analysis for General Censored Data Subject to Inverse Gaussian Distribution
Xinlei Wen, Zhihua Wang, Huimin Fu, Qiong Wu, Chengrui Liu	68	4	1257–1271	2019	1.0
平均評価: 0.0 / 5 (0 件のレビュー)
A General Accelerated Destructive Degradation Testing Model for Reliability Analysis
Yu Ding, Qingyu Yang, Caleb B. King, Yili Hong	68	4	1272–1282	2019	1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Reliability Modeling of Infrastructure Load-Sharing Systems With Workload Adjustment
Qiuzhuang Sun, Zhi-Sheng Ye, Matthew Revie, Lesley Walls	68	4	1283–1295	2019	0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Stress–Strength Parameter Estimation Based on Type-II Hybrid Progressive Censored Samples for a Kumaraswamy Distribution
Akram Kohansal, Saraless Nadarajah	68	4	1296–1310	2019	1.0
平均評価: 0.0 / 5 (0 件のレビュー)
On Accelerated Life Testing When the AFT Model Fails
Vilijandas Bagdonavičius, Rūta Levulienė	68	4	1311–1319	2019	0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Degradation Modeling Using Stochastic Processes With Random Initial Degradation
Lijuan Shen, Yudong Wang, Qingqing Zhai, Yincai Tang	68	4	1320–1329	2019	0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Cryptographic Attribute-Based Access Control (ABAC) for Secure Decision Making of Dynamic Policy With Multiauthority Attribute Tokens
Yan Zhu, Ruyun Yu, Di Ma, William Cheng-Chung Chu	68	4	1330–1346	2019	1.0
平均評価: 0.0 / 5 (0 件のレビュー)