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IEEE Transactions on Reliability - 巻 68 / 号 2
タイトル
著者
巻
号
ページ
年
PKV
Exponential Dispersion Process for Degradation Analysis
Shirong Zhou, Ancha Xu
68
2
398–409
2019
0.0
平均評価: 0.0 / 5
(0 件のレビュー)
The Duration of Load Effect in Lumber as Stochastic Degradation
Samuel W. K. Wong, James V. Zidek
68
2
410–419
2019
0.0
平均評価: 0.0 / 5
(0 件のレビュー)
Analysis of Weibull Step-Stress Model In Presence of Competing Risk
Debashis Samanta, Arindam Gupta, Debasis Kundu
68
2
420–438
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
Birnbaum Importance Measure for Reliability Systems With Dependent Components
Patryk Miziuła, Jorge Navarro
68
2
439–450
2019
0.0
平均評価: 0.0 / 5
(0 件のレビュー)
On the Marshall–Olkin Copula Model for Network Reliability Under Dependent Failures
Omar Matus, Javiera Barrera, Eduardo Moreno, Gerardo Rubino
68
2
451–461
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
A Competing Risks Model With Multiply Censored Reliability Data Under Multivariate Weibull Distributions
Tsai-Hung Fan, Yi-Fu Wang, She-Kai Ju
68
2
462–475
2019
0.0
平均評価: 0.0 / 5
(0 件のレビュー)
Service Reliability in an HC: Considering From the Perspective of Scheduling With Load-Dependent Machine Reliability
Chubo Liu, Kenli Li, Jie Liang, Keqin Li
68
2
476–495
2019
0.0
平均評価: 0.0 / 5
(0 件のレビュー)
Optimal Maintenance Design-Oriented Nonprobabilistic Reliability Methodology for Existing Structures Under Static and Dynamic Mixed Uncertainties
Lei Wang, Qiang Ren, Yujia Ma, Di Wu
68
2
496–513
2019
0.0
平均評価: 0.0 / 5
(0 件のレビュー)
Multithreaded and Reconvergent Aware Algorithms for Accurate Digital Circuits Reliability Estimation
Walid Ibrahim, Hazem Ibrahim
68
2
514–525
2019
0.0
平均評価: 0.0 / 5
(0 件のレビュー)
Fast Semiconductor Reliability Assessments Using SPRT
Wei-Ting Kary Chien, Andrew Chung, Way Kuo
68
2
526–538
2019
0.0
平均評価: 0.0 / 5
(0 件のレビュー)
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