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IEEE Transactions on Reliability - 巻 65 / 号 3

タイトル
著者 ページ PKV
Automated Bug Report Field Reassignment and Refinement Prediction
Xin Xia, David Lo, Emad Shihab, Xinyu Wang 65 3 1094–1113 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Prioritizing Change-Impact Analysis via Semantic Program-Dependence Quantification
Haipeng Cai, Raul Santelices, Siyuan Jiang 65 3 1114–1132 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Online Prediction and Improvement of Reliability for Service Oriented Systems
Zuohua Ding, Ting Xu, Tiantian Ye, Yuan Zhou 65 3 1133–1148 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
A Diversity Model Based on Failure Distribution and its Application in Safety Cases
Luping Chen, John H. R. May 65 3 1149–1162 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Formal Verification With Frama-C: A Case Study in the Space Software Domain
Rovedy Aparecida Busquim e Silva, Nanci Naomi Arai, Luciana Akemi Burgareli, Jose Maria Parente de Oliveira, Jorge Sousa Pinto 65 3 1163–1179 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Dynamically Discovering Likely Memory Layout to Perform Accurate Fuzzing
Kai Chen, Yingjun Zhang, Peng Liu 65 3 1180–1194 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
The Use of Security Tactics in Open Source Software Projects
Jungwoo Ryoo, Bryan Malone, Phillip A. Laplante, Priya Anand 65 3 1195–1204 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Automated Integration Testing Using Logical Contracts
Dianxiang Xu, Weifeng Xu, Manghui Tu, Ning Shen, William Chu, Chih-Hung Chang 65 3 1205–1222 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
To What Extent is Stress Testing of Android TV Applications Automated in Industrial Environments?
Bo Jiang, Peng Chen, Wing Kwong Chan, Xinchao Zhang 65 3 1223–1239 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
K-Terminal Reliability of d-Trapezoid Graphs
Sudarshan Roy, Krishna Daripa, Alak Kumar Datta 65 3 1240–1247 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)