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IEEE Transactions on Reliability - 巻 66 / 号 4

タイトル
著者 巻 号 ページ 年 PKV
Reliability Analysis of Ethernet Ring Mesh Networks
Fathollah Bistouni, Mohsen Jahanshahi 66 4 1238–1252 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Dynamic Defense Resource Allocation for Minimizing Unsupplied Demand in Cyber-Physical Systems Against Uncertain Attacks
Huadong Mo, Giovanni Sansavini 66 4 1253–1265 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
A Two-Stage Latent Variable Estimation Procedure for Time-Censored Accelerated Degradation Tests
Ming-Yung Lee, Cheng-Hung Hu, Jen Tang 66 4 1266–1279 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Maintenance Scheduling for Multicomponent Systems with Hidden Failures
Bin Liu, Ruey-Huei Yeh, Min Xie, Way Kuo 66 4 1280–1292 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
A Prognostic Model for Stochastic Degrading Systems With State Recovery: Application to Li-Ion Batteries
Zheng-Xin Zhang, Xiao-Sheng Si, Chang-Hua Hu, Michael G. Pecht 66 4 1293–1308 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Maintenance Strategy Optimization for Complex Power Systems Susceptible to Maintenance Delays and Operational Dynamics
Hindolo George-Williams, Edoardo Patelli 66 4 1309–1330 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Statistical Modeling of Bearing Degradation Signals
Dong Wang, Kwok-Leung Tsui 66 4 1331–1344 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Two-Phase Degradation Process Model With Abrupt Jump at Change Point Governed by Wiener Process
Dejing Kong, Narayanaswamy Balakrishnan, Lirong Cui 66 4 1345–1360 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Online Estimation Methods for the Gamma Degradation Process
Christian Paroissin 66 4 1361–1367 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Remaining Useful Life Prediction for Degradation Processes With Long-Range Dependence
Hanwen Zhang, Maoyin Chen, Xiaopeng Xi, Donghua Zhou 66 4 1368–1379 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)