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IEEE Transactions on Reliability - 巻 74 / 号 3

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著者 ページ PKV
PCBSmith: An Effective Schematic Generator for Testing PCB Design Tool Chain
Xu Zhao, He Jiang, Xiaochen Li, Shikai Guo, Zhilei Ren, Peiyu Zou, Huijiang Liu 74 3 3281–3295 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
Boosting Identifier Renaming Opportunity Identification via Context-Based Deep Code Representation
Jingxuan Zhang, Zhuhang Li, Jiahui Liang, Zhiqiu Huang 74 3 3296–3310 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
Modeling and Verification of MRSCAN Based on MapReduce Framework
Zhengkang Zuo, Yuhan Ke, Ying Hu, Qing Huang, Zhicheng Zeng, Changjing Wang 74 3 3311–3325 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
Applying Lexicographical Ordering to Software Product Line Testing
Tao Li, Chenhui Cui, Yinyin Xu, Rubing Huang 74 3 3326–3340 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
Insights From Bugs in FPGA High-Level Synthesis Tools: An Empirical Study of Bambu Bugs
Zun Wang, He Jiang, Xiaochen Li, Shikai Guo, Xu Zhao, Yi Zhang 74 3 3341–3355 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
Unsupervised Software Defect Prediction Through Multiview Clustering
Zhiqiang Li, Hongyu Zhang, Xiao-Yuan Jing, Wangyang Yu, Yueyue Liu 74 3 3356–3370 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
Reliability Study of Critical Structural Redistribution Layers in Advanced Packaging: A Review
Jiajie Jin, Peisheng Liu, Yaohui Deng, Zhao Zhang 74 3 3371–3382 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
What Causes Bugs in Numerical Simulation Software? An Empirical Study
Xiaochen Li, Youcheng Zhu, Shikai Guo, He Jiang 74 3 3383–3397 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
Test Case Generation for Ethereum Smart Contracts Based on Cross-Contract Data Flow Analysis
Xingya Wang, Yumao Yang, Linwei Liu, Zhenyu Chen, Song Huang 74 3 3398–3411 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)
CFG2AT: Control Flow Graph and Graph Attention Network-Based Software Defect Prediction
Haiyang Liu, Zhiqiang Li, Hongyu Zhang, Xiao-Yuan Jing, Jinhui Liu 74 3 3412–3426 2025 0.98
平均評価: 0.0 / 5 (0 件のレビュー)