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IEEE Transactions on Reliability - 巻 73 / 号 1

タイトル
著者 ページ PKV
AXI Lite Redundant On-Chip Bus Interconnect for High Reliability Systems
Jesús Lázaro, Armando Astarloa, Aitzol Zuloaga, José Ángel Araujo, Jaime Jiménez 73 1 602–607 2024 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Positioning Accuracy Analysis of Industrial Robots Based on Non-Probabilistic Time-Dependent Reliability
Chen Yang, Wanze Lu, Yuanqing Xia 73 1 608–621 2024 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Dy-MFNS-CAC: An Encoding Mechanism to Suppress the Crosstalk and Repair the Hard Faults in Rectangular TSV Arrays
Chen Wei, Xiaole Cui, Xiaoxin Cui 73 1 622–636 2024 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Log Anomaly Detection by Adversarial Autoencoders With Graph Feature Fusion
Yuxia Xie, Kai Yang 73 1 637–649 2024 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
A Mission-Reliability-Oriented Health Prognosis Approach for Manufacturing Systems Considering Operational Uncertainty
Yuqi Cai, Yihai He, Rui Shi, Jiayang Li 73 1 650–663 2024 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Ensemble Kernel-Mapping-Based Ranking Support Vector Machine for Software Defect Prediction
Zhanyu Yang, Lu Lu, Quanyi Zou 73 1 664–679 2024 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Application of Weighted Combinations of Activation Functions to Defect Prediction in Software Development
Wei-Chun Su, Chin-Yu Huang 73 1 680–694 2024 2.0
平均評価: 0.0 / 5 (0 件のレビュー)
What's Wrong With Low-Code Development Platforms? An Empirical Study of Low-Code Development Platform Bugs
Dong Liu, He Jiang, Shikai Guo, Yuting Chen, Lei Qiao 73 1 695–709 2024 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
ME-SFP: A Mixture-of-Experts-Based Approach for Software Fault Prediction
Aman Omer, Santosh Singh Rathore, Sandeep Kumar 73 1 710–725 2024 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Software Bug Prediction Using Reward-Based Weighted Majority Voting Ensemble Technique
Rakesh Kumar, Amrita Chaturvedi 73 1 726–740 2024 1.0
平均評価: 0.0 / 5 (0 件のレビュー)