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IEEE Transactions on Reliability - 巻 69 / 号 2

タイトル
著者 ページ PKV
Time-Dependent Reliability Analysis of Deteriorating Structures Based on Phase-Type Distributions
Junxiang Li, Jianqiao Chen, Xiaosheng Zhang 69 2 545–557 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
An Empirical Study of Regression Bug Chains in Linux
Guanping Xiao, Zheng Zheng, Bo Jiang, Yulei Sui 69 2 558–570 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Reliability Improvement Allocation Method Considering Common Cause Failures
Yingsai Cao, Sifeng Liu, Zhigeng Fang, Wenjie Dong 69 2 571–580 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Modeling of Timing Constraints in Hybrid Systems Using Event-B
Wen Su 69 2 581–593 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
A System-Level Framework for Analytical and Empirical Reliability Exploration of STT-MRAM Caches
Elham Cheshmikhani, Hamed Farbeh, Hossein Asadi 69 2 594–610 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Diversity-Oriented Test Suite Generation for EFSM Model
Ruilian Zhao, Weiwei Wang, Yuqi Song, Zheng Li 69 2 611–631 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Automated Prototype Generation From Formal Requirements Model
Yilong Yang, Xiaoshan Li, Wei Ke, Zhiming Liu 69 2 632–656 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Semiautomated Metamorphic Testing Approach for Geographic Information Systems: An Empirical Study
Zhan-Wei Hui, Song Huang, Caslon Chua, Tsong Yueh Chen 69 2 657–673 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Runtime Verification on Hierarchical Properties of ROS-Based Robot Swarms
Chi Hu, Wei Dong, Yonghui Yang, Hao Shi, Ge Zhou 69 2 674–689 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Vulnerabilities and Reliability of ReRAM Based PUFs and Memory Logic
Thomas Schultz, Rashmi Jha, Matt Casto, Brian Dupaix 69 2 690–698 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)