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IEEE Transactions on Reliability - 巻 66 / 号 3

タイトル
著者 ページ PKV
Line: Evaluating Software Applications in Unreliable Environments
Juan F. Pérez, Giuliano Casale 66 3 837–853 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Mutation Reduction Strategies Considered Harmful
Rahul Gopinath, Iftekhar Ahmed, Mohammad Amin Alipour, Carlos Jensen, Alex Groce 66 3 854–874 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
A Game Theoretic Approach to Network Reliability Assessment
Xiaoge Zhang, Sankaran Mahadevan 66 3 875–892 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Improved Dynamic Dependability Assessment Through Integration With Prognostics
Jose Ignacio Aizpurua, Victoria M. Catterson, Yiannis Papadopoulos, Ferdinando Chiacchio, Gabriele Manno 66 3 893–913 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Estimation of Remaining Useful Lifetime of Piezoelectric Transducers Based on Self-Sensing
James Kuria Kimotho, Tobias Hemsel, Walter Sextro 66 3 914–923 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Multiple-Phase Modeling of Degradation Signal for Condition Monitoring and Remaining Useful Life Prediction
Yuxin Wen, Jianguo Wu, Yuan Yuan 66 3 924–938 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Sensory-Based Failure Threshold Estimation for Remaining Useful Life Prediction
Abdallah Chehade, Scott Bonk, Kaibo Liu 66 3 939–949 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Combined Redundancy Allocation and Maintenance Planning Using a Two-Stage Stochastic Programming Model for Multiple Component Systems
Xiaoqiang Bei, Nida Chatwattanasiri, David W. Coit, Xiaoyan Zhu 66 3 950–962 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)