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IEEE Transactions on Reliability - 巻 66 / 号 1

タイトル
著者 巻 号 ページ 年 PKV
Condition Parameter Estimation for Photovoltaic Buck Converters Based on Adaptive Model Observers
Mingyang Li, Weidong Zhang, Qingpei Hu, Huairui Guo, Jian Liu 66 1 148–160 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
A Novel Indicator for Mechanical Failure and Life Prediction Based on Debris Monitoring
Zhaohui Cen, Paul Stewart 66 1 161–169 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Evaluation of Conducted Emission Test Methods for Charge Pump DC/DC Converters
Wei Hong, Shaoping Wang, Mileta M. Tomovic, Haokuo Liu, Jian Shi, Xingjian Wang 66 1 170–177 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Model Event/Fault Trees With Dynamic Uncertain Causality Graph for Better Probabilistic Safety Assessment
Simon Kennedy, Mehmet Rasit Yuce, Jean-Michel Redouté 66 1 178–188 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Optimal Periodic Inspections and Activation Sequencing Policy in Standby Systems With Condition-Based Mode Transfer
Zhenxu Zhou, Qin Zhang 66 1 189–201 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Continuous-Observation Partially Observable Semi-Markov Decision Processes for Machine Maintenance
Yuanshun Dai, Gregory Levitin, Liudong Xing 66 1 202–218 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Maintenance Policies for a Deteriorating System Subject to Non-Self-Announcing Failures
Mimi Zhang, Matthew Revie 66 1 219–232 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Improved Multiple Faults-Aware Placement Strategy: Reducing the Overheads and Error Rates in Digital Circuits
Büşra Keleş, Salih Tekin, Niyazi Onur Bakır 66 1 233–244 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
A Scalable Solution to Soft Error Tolerant Circuit Design Using Partitioning-Based Gate Sizing
Mohamad Imran Bandan, Samuel Pagliarini, Jimson Mathew, Dhiraj Pradhan 66 1 245–256 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)