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IEEE Transactions on Reliability - 巻 65 / 号 4

タイトル
著者 ページ PKV
Some Challenges and Opportunities in Reliability Engineering
Enrico Zio 65 4 1769–1782 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
MEMRES: A Fast Memory System Reliability Simulator
Shaodi Wang, Henry Hu, Hongzhong Zheng, Puneet Gupta 65 4 1783–1797 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Cold Standby Systems With Imperfect Backup
Gregory Levitin, Liudong Xing, Yuanshun Dai 65 4 1798–1809 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Collective Personalized Change Classification With Multiobjective Search
Xin Xia, David Lo, Xinyu Wang, Xiaohu Yang 65 4 1810–1829 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Model-Based Fault Diagnosis of a Planetary Gear: A Novel Approach Using Transmission Error
Jungho Park, Jong Moon Ha, Hyunseok Oh, Byeng D. Youn, Joo-Ho Choi, Nam Ho Kim 65 4 1830–1841 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Network Nodal Independence, Hierarchical Path Search, and Model Reuse for Network Availability Computation
Jason W. Rupe 65 4 1842–1851 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Secure and Dependable NoC-Connected Systems on an FPGA Chip
Taimour Wehbe, Xiaofang Wang 65 4 1852–1863 2016 2.0
平均評価: 0.0 / 5 (0 件のレビュー)
On Ageing Concepts for Repairable Items From Heterogeneous Populations
Ji Hwan Cha, Maxim Finkelstein 65 4 1864–1870 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
Error Mitigation Using Approximate Logic Circuits: A Comparison of Probabilistic and Evolutionary Approaches
Antonio J. Sanchez-Clemente, Luis Entrena, Radek Hrbacek, Lukas Sekanina 65 4 1871–1883 2016 1.0
平均評価: 0.0 / 5 (0 件のレビュー)