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IEEE Transactions on Reliability - 巻 65 / 号 3

タイトル
著者 ページ PKV
The Extra Connectivity, Extra Conditional Diagnosability, and t/m-Diagnosability of Arrangement Graphs
Li Xu, Limei Lin, Shuming Zhou, Sun-Yuan Hsieh 65 3 1248–1262 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
New Method in Searching for All Minimal Paths for the Directed Acyclic Network Reliability Problem
Wei-Chang Yeh 65 3 1263–1270 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Reliability and Maintenance Models for a Competing-Risk System Subjected to Random Usage
Kamyar Sabri-Laghaie, Rassoul Noorossana 65 3 1271–1283 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Maintenance Policy for a System With Stochastically Dependent Failure Modes With Shock-Accumulation Effect
Ji Hwan Cha, Carmen Sangüesa, Inmaculada Torres Castro 65 3 1284–1297 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
General (N,T,τ) Opportunistic Maintenance for Multicomponent Systems With Evident and Hidden Failures
Lu Zhao, Maoyin Chen, Donghua Zhou 65 3 1298–1313 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
A Model-Based Method for Remaining Useful Life Prediction of Machinery
Yaguo Lei, Naipeng Li, Szymon Gontarz, Jing Lin, Stanislaw Radkowski, Jacek Dybala 65 3 1314–1326 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Optimal Design for Destructive Degradation Tests With Random Initial Degradation Values Using the Wiener Process
Xun Xiao, Zhisheng Ye 65 3 1327–1342 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Parametric Bootstrap Goodness-of-Fit Tests for Imperfect Maintenance Models
Cécile Chauvel, Jean-Yves Dauxois, Laurent Doyen, Olivier Gaudoin 65 3 1343–1359 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Statistical Approach for Nondestructive Incipient Crack Detection and Characterization Using Kullback-Leibler Divergence
Jinane Harmouche, Claude Delpha, Demba Diallo, Yann Le Bihan 65 3 1360–1368 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Susceptibility of Operational Amplifiers to Conducted EMI Injected Through the Ground Plane into Their Output Terminal
Anna Richelli, Giovanni Delaini, Marco Grassi, Jean-Michel Redouté 65 3 1369–1379 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)