IEEE Transactions on Reliability - 巻 65 / 号 1
| タイトル | |||||||||
|---|---|---|---|---|---|---|---|---|---|
| 著者 | 巻 | 号 | ページ | 年 | PKV | ||||
| A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes Under Competing Risks | |||||||||
| Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling | 65 | 1 | 469–485 | 2016 | 0.0 | ||||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| Aggregate Discounted Warranty Cost Forecast for a New Product Considering Stochastic Sales | |||||||||
| Wei Xie, Zhi-Sheng Ye | 65 | 1 | 486–497 | 2016 | 0.0 | ||||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||