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IEEE Transactions on Reliability - 巻 65 / 号 1

タイトル
著者 巻 号 ページ 年 PKV
Modeling and Analysis of Attacks and Counter Defense Mechanisms for Cyber Physical Systems
Robert Mitchell, Ing-Ray Chen 65 1 350–358 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Conditional Inactivity Time of Components in a Coherent Operating System
Mahdi Tavangar 65 1 359–369 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Estimation of Reliability in a Multicomponent Stress-Strength Model Based on a Marshall-Olkin Bivariate Weibull Distribution
Mustafa Nadar, Fatih Kızılaslan 65 1 370–380 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Heterogeneous Warm Standby Multi-Phase Systems With Variable Mission Time
Gregory Levitin, Liudong Xing, Amir Ehsani Zonouz, Yuanshun Dai 65 1 381–393 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Heterogeneous Non-Repairable Warm Standby Systems With Periodic Inspections
Gregory Levitin, Liudong Xing, Yuanshun Dai 65 1 394–409 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Improved Sampling Plans for Combinatorial Invariants of Coherent Systems
Radislav Vaisman, Dirk P. Kroese, Ilya B. Gertsbakh 65 1 410–424 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Component Level Versus System Level k-Out-of-n Assembly Systems
Gaofeng Da, Weiyong Ding 65 1 425–433 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
A Generalized Signature of Repairable Coherent Systems
Majid Chahkandi, Fabrizio Ruggeri, Alfonso Suárez-Llorens 65 1 434–445 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Likelihood Inference Under Proportional Hazards Model for One-Shot Device Testing
Man Ho Ling, Hon Yiu So, Narayanaswamy Balakrishnan 65 1 446–458 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Optimal Two-Variable Accelerated Degradation Test Plan for Gamma Degradation Processes
Tzong-Ru Tsai, Wen-Yun Sung, Y. L. Lio, Shing I. Chang, Jye-Chyi Lu 65 1 459–468 2016 0.0
平均評価: 0.0 / 5 (0 件のレビュー)