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Quality and Reliability Engineering International - Volume 41 / Issue 3

Title
Authors Volume Issue Page Year PKV
Quantitative Risk Assessment for Autonomous Vehicles: Integrating Functional Resonance Analysis Method and Bayesian Network
Chengwen Deng, Yufeng Li, Qi Liu, Xiangyu Zheng, Ke Sun 41 3 970–991 2024 4.0
Average Rating: 0.0 / 5 (0 Reviews)
Adaptive EWMA Control Chart by Adjusting the Risk Factors through Artificial Neural Network
Abdullah Ali Ahmadini, Tahir Abbas, Hadeel AlQadi 41 3 992–1001 2024 5.0
Average Rating: 0.0 / 5 (0 Reviews)
A Review of Dynamic Fault Tree Analysis and Capacity Degradation for Complex Redundant Systems
Michael Rubin, Dongping Du 41 3 1161–1181 2024 3.0
Average Rating: 0.0 / 5 (0 Reviews)
Joint Optimization of Preventive Replacement and Spare Part Ordering for Single‐Unit Systems With Mixed Inspections
Yongchao Liu, Guanjun Wang, Peng Liu 41 3 919–932 2024 3.0
Average Rating: 0.0 / 5 (0 Reviews)
Performance of the Shiryaev–Roberts‐Type Scheme in Monitoring Weibull Shape Parameter Based on Type II Censored Data
Dan Yu, Amitava Mukherjee, Zhi Song, Peile Chen, Jiujun Zhang 41 3 1002–1024 2024 3.0
Average Rating: 0.0 / 5 (0 Reviews)
Reliability Assessment for Dual Constant‐Stress Accelerated Life Test Based on Weibull Distribution With Type‐II Censoring
Xuefeng Feng, Jiayin Tang 41 3 1025–1040 2024 3.0
Average Rating: 0.0 / 5 (0 Reviews)
Prognostic‐Based Active Battery Degradation Management in Wireless Sensor Networks for Group Replacement
Lang Wu, Qiang Zhou, Hongki Jo, Muhammad M. Saleem, Qiang Qu, Jong‐Hyun Jeong 41 3 933–942 2024 5.0
Average Rating: 0.0 / 5 (0 Reviews)
Dynamic Process Dispersion Monitoring Through Bayesian‐Driven Smoothing Adjustments
Imad Khan, Fahad R. Albogamy 41 3 1041–1058 2024 4.0
Average Rating: 0.0 / 5 (0 Reviews)
Estimating the Generalizations of Process Capability Index Cpmk$C_{pmk}$ in the Presence of Outliers
Hamideh Iranmanesh, Mehdi Jabbari Nooghabi, Abbas Parchami 41 3 1059–1072 2024 3.0
Average Rating: 0.0 / 5 (0 Reviews)
The ENBIS‐23 Quality and Reliability Engineering International Special Issue
Bertrand Iooss, Christian H. Weiß 41 3 917–918 2024 3.0
Average Rating: 0.0 / 5 (0 Reviews)