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Quality and Reliability Engineering International - Volume 38 / Issue 2

Title
Authors Volume Issue Page Year PKV
A robust hybrid exponentially weighted moving average chart for monitoring time between events
Majid Khan, Muhammad Aslam, Syed Masroor Anwar, Babar Zaman 38 2 895–923 2021 5.92
Average Rating: 0.0 / 5 (0 Reviews)
Design of Experiments and machine learning for product innovation: A systematic literature review
Rosa Arboretti, Riccardo Ceccato, Luca Pegoraro, Luigi Salmaso 38 2 1131–1156 2021 5.92
Average Rating: 0.0 / 5 (0 Reviews)
A synthetic multivariate exponentially weighted moving average scheme for monitoring of bivariate Gamma distributed processes
FuPeng Xie, Amitava Mukherjee, JinSheng Sun, AnAn Tang, XueLong Hu 38 2 848–876 2021 4.94
Average Rating: 0.0 / 5 (0 Reviews)
Bayesian inference for modified Weibull distribution under simple step‐stress model based on type‐I censoring
Qasim Ramzan, Muhammad Amin, Muhammad Faisal 38 2 757–779 2021 4.92
Average Rating: 0.0 / 5 (0 Reviews)
EM‐based likelihood inference for one‐shot device test data under log‐normal lifetimes and the optimal design of a CSALT plan
Narayanaswamy Balakrishnan, Elena Castilla 38 2 780–799 2021 4.92
Average Rating: 0.0 / 5 (0 Reviews)
A novel EWMA mean chart with its extensions
Abdul Haq, Shahid Iqbal, Michael B. C. Khoo 38 2 971–988 2021 4.9
Average Rating: 0.0 / 5 (0 Reviews)
A homogeneously weighted moving average control chart for monitoring time between events
Muhammad Aslam, Majid Khan, Syed Masroor Anwar, Babar Zaman 38 2 1013–1044 2021 4.9
Average Rating: 0.0 / 5 (0 Reviews)
Improving the performance of the attribute charts: X¯tn$\bar{X}_{tn}$ and Stn2$S^2_{tn}$
Tsubasa Yamauchi, Linda Lee Ho, Roberto da Costa Quinino 38 2 703–732 2021 3.96
Average Rating: 0.0 / 5 (0 Reviews)
Statistical reliability analysis of electronic devices using generalized progressively hybrid censoring plan
Ahmed Elshahhat, Wael S. Abu El Azm 38 2 1112–1130 2022 3.96
Average Rating: 0.0 / 5 (0 Reviews)
A multi‐image monitoring framework for statistical process control to improve manufacturing systems
Shengfeng Chen, Lee Wells 38 2 679–702 2021 3.94
Average Rating: 0.0 / 5 (0 Reviews)