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Quality and Reliability Engineering International - Volume 33 / Issue 1

Title
Authors Volume Issue Page Year PKV
On the Performance of Control Charts for Simultaneous Monitoring of Location and Dispersion Parameters
Babar Zaman, Muhammad Riaz, Muhammad Hisyam Lee 33 1 37–56 2016 12.94
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A Situationally Sample‐Size‐Adjusted Sampling Scheme Based on Process Yield Verification
Chien‐Wei Wu, Ming‐Hung Shu, Shih‐Wen Liu 33 1 57–69 2016 11.94
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Alternative Modeling Strategies for Characterizing Radio Performance
Cynthia G. Zessin, Michael H. Oelrich, Gregory T. Hutto, Amber Romeo, Armando J. Rios, James R. Simpson 33 1 215–224 2016 10.9
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Economic Impact of Software Patching and Optimal Release Scheduling
Adarsh Anand, Mohini Agarwal, Yoshinobu Tamura, Shigeru Yamada 33 1 149–157 2016 9.92
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Optimal Designs of the Variable Sample Size Chart Based on Median Run Length and Expected Median Run Length
W. L. Teoh, J. K. Chong, M. B. C. Khoo, P. Castagliola, W. C. Yeong 33 1 121–134 2016 8.96
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A Bivariate Semiparametric Control Chart Based on Order Statistics
Markos V. Koutras, Elisavet M. Sofikitou 33 1 183–202 2016 8.92
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A Novel Approach to Simultaneous Robust Design of Product Parameters and Tolerances Using Quality Loss and Multivariate ANOVA Concepts
Hossein Hazrati‐Marangaloo, Hamid Shahriari 33 1 71–85 2016 7.92
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Monitoring Weibull Quantiles by EWMA Charts Based on a Pivotal Quantity Conditioned on Ancillary Statistics
Francis Pascual, Sansi Yang, Min Ye 33 1 103–119 2016 6.92
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Product Component Genealogy Modeling and Field‐failure Prediction
Caleb King, Yili Hong, William Q. Meeker 33 1 135–148 2016 6.92
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Synthetic and Runs‐Rules Charts Combined With an Chart: Theoretical Discussion
Sandile C. Shongwe, Marien A. Graham 33 1 7–35 2016 6.92
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