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Wafer Flatness Measurement System with Sub-Nanometer Precision Cancelling the Noise Caused by a Light Source Using Dual Heterodyne Interferometer
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Kazuhiko TAHARA, Hideki MATSUOKA, Masato KANNAKA, Takashi KITA
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67 |
9 |
829–833 |
2018 |
8.54 |
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Average Rating: 0.0 / 5
(0 Reviews)
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Plant Growth under High Power Operation of White-Light-Emitting-Diodes by Operating-Current-Pulse-Width Control
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Yoshiaki HARADA, Hirofumi KASADA, Koshi ANDO, Tomoki ABE, Kunio ICHINO
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67 |
9 |
834–839 |
2018 |
7.6 |
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Average Rating: 0.0 / 5
(0 Reviews)
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Field-Effect Transistors Based on PbS Colloidal Nano-Dot Films Treated with Ammonium Sulfide Solution
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Yumi TAKEICHI, Nobuhiro MITANI, Kazuyuki UNO, Ichiro TANAKA
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67 |
9 |
840–843 |
2018 |
11.67 |
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Average Rating: 0.0 / 5
(0 Reviews)
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Fabrication of Y Doped HfO2 Epitaxial Films Directly on (001) Si Substrate
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Daiki KAMADA, Kenshi TAKADA, Takeshi YOSHIMURA, Norifumi FUJIMURA
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67 |
9 |
844–848 |
2018 |
9.61 |
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Average Rating: 0.0 / 5
(0 Reviews)
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Characteristics of the Tungsten Trioxide Films Fabricated by a Sol-Gel Method
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Kazuto KOIKE, Satoshi MURAKAMI, Tomoya IWATA, Ryouma KAMEI, Mitsuaki Y ...
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67 |
9 |
849–853 |
2018 |
11.61 |
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Average Rating: 0.0 / 5
(0 Reviews)
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Relation between Diffraction Young's Modulus Ratio and Elastic Anisotropy in Metals
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Setsuo TAKAKI, Takuro MASUMURA, Fulin JIANG, Toshihiro TSUCHIYAMA
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67 |
9 |
855–860 |
2018 |
9.39 |
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Average Rating: 0.0 / 5
(0 Reviews)
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Analytical Study on Damage Evaluation of Metallic Materials Subjected to High Velocity Impingement of a Solid Particle
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Kiyohiro ITO, Taisuke HAMADA, Masayuki ARAI
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67 |
9 |
861–868 |
2018 |
10.54 |
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Average Rating: 0.0 / 5
(0 Reviews)
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