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Profile monitoring via a nonparametric Bayesian online learning framework: Application to wafer map data in the semiconductor manufacturing industry
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Daewon Yang, Jinsu Park, Hohyun Jung, Yeonseung Chung
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57 |
5 |
415–439 |
2025 |
4.0 |
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Average Rating: 0.0 / 5
(0 Reviews)
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Bayesian sequential I-optimal designs for split-plot experiments under model uncertainty
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Yao Xiao, Po Yang, Na Zou
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57 |
5 |
440–459 |
2025 |
5.0 |
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Average Rating: 0.0 / 5
(0 Reviews)
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An adaptive CUSUM chart for robust monitoring of multivariate processes
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Xiulin Xie
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57 |
5 |
398–414 |
2025 |
3.0 |
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Average Rating: 0.0 / 5
(0 Reviews)
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A task-incremental semi-supervised meta learning method for few-shot RUL prediction
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Ying Wang, Feifan Wang, Di Wang, Nan Chen
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57 |
5 |
460–475 |
2025 |
5.0 |
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Average Rating: 0.0 / 5
(0 Reviews)
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Optimal coverage design for experiments with multiple types of factors
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Taihe Yi, Zhengqiang Pan, Kai Chen
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57 |
5 |
487–499 |
2025 |
4.0 |
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Average Rating: 0.0 / 5
(0 Reviews)
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Bias in the Kaplan–Meier estimator for small samples
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Yuxin Qin, Heather Sasinowska, Lawrence M. Leemis
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57 |
5 |
476–486 |
2025 |
6.0 |
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Average Rating: 0.0 / 5
(0 Reviews)
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A new adaptive EWMA control chart based on Catoni’s function for monitoring process variability
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Ruoyu Zhou, Lianjie Shu, Wenpo Huang, Yanting Li
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57 |
5 |
383–397 |
2025 |
5.0 |
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Average Rating: 0.0 / 5
(0 Reviews)
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Two-stage design for failure probability estimation with Gaussian process surrogates
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Annie S. Booth, S. Ashwin Renganathan
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57 |
5 |
500–516 |
2025 |
3.0 |
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Average Rating: 0.0 / 5
(0 Reviews)
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