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Journal of Quality Technology - Volume 53 / Issue 3

Title
Authors Volume Issue Page Year PKV
Time series: a data analysis approach using R
Zhanpan Zhang 53 3 331–331 2020 3.0
Average Rating: 0.0 / 5 (0 Reviews)
spc4sts: Statistical process control for stochastic textured surfaces in R
Anh Tuan Bui, Daniel W. Apley 53 3 219–242 2020 4.0
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Correlation-based dynamic sampling for online high dimensional process monitoring
Mohammad Nabhan, Yajun Mei, Jianjun Shi 53 3 289–308 2020 4.0
Average Rating: 0.0 / 5 (0 Reviews)
Non-uniform space filling (NUSF) designs
Lu Lu, Christine M. Anderson-Cook, Towfiq Ahmed 53 3 309–330 2020 2.0
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On computing multiple change points for the gamma distribution
Xun Xiao, Piao Chen, Zhisheng Ye, Kwok-Leung Tsui 53 3 267–288 2020 4.0
Average Rating: 0.0 / 5 (0 Reviews)
A mixed integer optimization approach for model selection in screening experiments
Alan R. Vazquez, Eric D. Schoen, Peter Goos 53 3 243–266 2020 6.0
Average Rating: 0.0 / 5 (0 Reviews)
Probability, Lawrence M. Leemis. Lighting Source, La Vergne, TN, 2017, 566 pp., $45.00, ISBN: 978-0982917473
Shuai Huang 53 3 332–332 2020 5.0
Average Rating: 0.0 / 5 (0 Reviews)