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Journal of Materials Science - 巻 55 / 号 19

タイトル
著者 巻 号 ページ 年 PKV
Influence of frequency and gamma irradiation on the electrical characteristics of Er2O3, Gd2O3, Yb2O3, and HfO2 MOS-based devices
Aysegul Kahraman, Seetharama C. Deevi, Ercan Yilmaz 55 19 7999–8040 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
In situ observation of two-step 90° domain reversal with different characteristics in PMN–38%PT single crystal
Erding Zhao, Ze Fang, Yongcheng Zhang 55 19 8041–8049 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Glass foams from acid-leached phlogopite waste
Helena Maria Deysel, Kent Berluti, Walter Wilhelm Focke 55 19 8050–8060 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Contamination of TiO2 thin films spin coated on rutile and soda–lime–silica substrates
I. I. Kabir, L. R. Sheppard, C. C. Sorrell 55 19 8061–8087 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Ferroelectric and piezoelectric response in (100)-oriented Mn-doped Bi0.5Na0.5TiO3–BaTiO3 thin films
Zihao Li, Xiaoli Huang, Zhihua Duan 55 19 8088–8094 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Hydrothermal synthesis of rutile TiO2 nanorods and their decoration with CeO2 nanoparticles as low-photocatalytic active ingredients in UV filtering applications
Alexander Morlando, Jared McNamara, Konstantin Konstantinov 55 19 8095–8108 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Architectural tailoring of orthorhombic MoO3 nanostructures toward efficient NO2 gas sensing
B. Geeta Rani, R. Saisri, K. Venkateswara Rao 55 19 8109–8122 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Understanding of scanning-system distortions of atomic-scale scanning transmission electron microscopy images for accurate lattice parameter measurements
Syota Fujinaka, Yukio Sato, Kenji Kaneko 55 19 8123–8133 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Enhanced electric-field-induced strain in 0.7Bi(1−x)SmxFeO3–0.3BaTiO3 lead-free ceramics
Zhuang Ma, Geng Li, Xiaojie Lou 55 19 8134–8144 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
The influence of ZSM-5 structure on As(V) adsorption performance: pseudomorphic transformation and grafting of rare-earth Ce onto ZSM-5
Xize Min, Chundi Zhou, Yongming Luo 55 19 8145–8154 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)