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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
2291 Structural Expected Lifetime Estimation for Systems With Multiple Failure Modes Based on Adaptive Learning Kriging Models
Hongyou Zhan, Hui Liu, Ning-Cong Xiao IEEE Transactions on Reliability 73 1 549–559 2024 5.68
平均評価: / 5 ( 件のレビュー)
2292 Physics-Guided Adversarial Machine Learning for Aircraft Systems Simulation
Houssem Ben Braiek, Thomas Reid, Foutse Khomh IEEE Transactions on Reliability 72 3 1161–1175 2023 5.68
平均評価: / 5 ( 件のレビュー)
2293 A Residual-Enhanced Dual-Model-Driven Method for Wind Turbine Condition Monitoring
Yu Wang, Congzhi Huang, Shuzhi Sam Ge IEEE Transactions on Reliability 75 1 1827–1841 2026 5.67
平均評価: / 5 ( 件のレビュー)
2294 Dynamically Relative Position Encoding-Based Transformer for Automatic Code Edit
Shiyi Qi, Yaoxian Li, Cuiyun Gao, Xiaohong Su, Shuzheng Gao, Zibin Zheng, Chuanyi Liu IEEE Transactions on Reliability 72 3 1147–1160 2023 5.66
平均評価: / 5 ( 件のレビュー)
2295 Reliable UAV Monitoring System Using Deep Learning Approaches
Zhuoran Cai, Zhiyuan Liu, Liang Kou IEEE Transactions on Reliability 71 2 973–983 2022 5.66
平均評価: / 5 ( 件のレビュー)
2296 Optimal Long-Run Imperfect Maintenance With Asymptotic Virtual Age
Ji Hwan Cha, Maxim Finkelstein IEEE Transactions on Reliability 65 1 187–196 2016 5.66
平均評価: / 5 ( 件のレビュー)
2297 A Stationary Grouping Maintenance Strategy Using Mean Residual Life and the Birnbaum Importance Measure for Complex Structures
Hai Canh Vu, Phuc Do, Anne Barros IEEE Transactions on Reliability 65 1 217–234 2016 5.66
平均評価: / 5 ( 件のレビュー)
2298 Reliability Computing Methods of Probabilistic Location Set Covering Problem Considering Wireless Network Applications
Zilong Feng, Hiroyuki Okamura, Tadashi Dohi, Won Young Yun IEEE Transactions on Reliability 73 1 290–303 2024 5.64
平均評価: / 5 ( 件のレビュー)
2299 A Load Sequence Design Method for Hydraulic Piston Pump Based on Time-Related Markov Matrix
Zhonghai Ma, Shaoping Wang, Chao Zhang, Mileta M. Tomovic, Tongyang Li IEEE Transactions on Reliability 67 3 1237–1248 2018 5.64
平均評価: / 5 ( 件のレビュー)
2300 A Prognostic Model for Stochastic Degrading Systems With State Recovery: Application to Li-Ion Batteries
Zheng-Xin Zhang, Xiao-Sheng Si, Chang-Hua Hu, Michael G. Pecht IEEE Transactions on Reliability 66 4 1293–1308 2017 5.64
平均評価: / 5 ( 件のレビュー)