Powered by Engineering Brain, Japan | What is PKV? | PKV Methodology | KnowledgeRank v4.0.0: PKV Trends of My Authored Papers Are Now Available on My Page

アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
1801 Estimation of Remaining Useful Lifetime of Piezoelectric Transducers Based on Self-Sensing
James Kuria Kimotho, Tobias Hemsel, Walter Sextro IEEE Transactions on Reliability 66 3 914–923 2017 7.64
平均評価: / 5 ( 件のレビュー)
1802 Combined Redundancy Allocation and Maintenance Planning Using a Two-Stage Stochastic Programming Model for Multiple Component Systems
Xiaoqiang Bei, Nida Chatwattanasiri, David W. Coit, Xiaoyan Zhu IEEE Transactions on Reliability 66 3 950–962 2017 7.64
平均評価: / 5 ( 件のレビュー)
1803 Real-Time Reliability Assessment of Multivariable Systems With Multiple Failure Modes
Junling Wang, Xiaobing Ma, Yongbo Zhang IEEE Transactions on Reliability 75 1 1869–1878 2026 7.63
平均評価: / 5 ( 件のレビュー)
1804 A Novel Hybrid Wavelet-deep Learning Framework for Advanced Structural Damage Detection
Oumayma Najem, Mohammed Benbrahim, Mohammed Nabil Kabbaj, Jaouad Boumhidi International Journal of Prognostics and Health Management 16 2 4568–None 2025 7.62
平均評価: / 5 ( 件のレビュー)
1805 Global Sensitivity Analysis of Dynamic Parameters to Industrial Robots Considering Spacetime Two-Dimensional Output Responses
Shunyu Wang, Jinhui Wu, Pengpeng Tian, Chenghu Tang, Yourui Tao IEEE Transactions on Reliability 74 2 2813–2826 2025 7.62
平均評価: / 5 ( 件のレビュー)
1806 Component Diagnosis Strategy of Star Graphs Interconnection Networks
Ziyi Wan, Limei Lin, Yanze Huang, Sun-Yuan Hsieh IEEE Transactions on Reliability 73 4 1907–1917 2024 7.62
平均評価: / 5 ( 件のレビュー)
1807 A Review of Resilience Metrics and Modeling Methods for Cyber-Physical Power Systems (CPPS)
Zhaojun Steven Li, Gongyu Wu, Rocco Cassandro, Huimin Wang IEEE Transactions on Reliability 73 1 53–58 2024 7.62
平均評価: / 5 ( 件のレビュー)
1808 Joint Multimission Selective Maintenance and Inventory Optimization for Multicomponent Systems Considering Stochastic Dependency
Xuefeng Kong, Jun Yang, Wenhua Chen, Jun Pan IEEE Transactions on Reliability 73 4 1967–1981 2024 7.62
平均評価: / 5 ( 件のレビュー)
1809 Elimination of Die-Pop Defect by Vacuum Reflow for Ultrathin Die With Warpage in Semiconductor Packaging Assembly
Siang Miang Yeo, Ho Kwang Yow, Keat Hoe Yeoh, Siti Nur Farhana Mohamad Azenal IEEE Transactions on Reliability 73 1 784–791 2024 7.62
平均評価: / 5 ( 件のレビュー)
1810 Generative Oversampling Methods for Handling Imbalanced Data in Software Fault Prediction
Santosh Singh Rathore, Satyendra Singh Chouhan, Dixit Kumar Jain, Aakash Gopal Vachhani IEEE Transactions on Reliability 71 2 747–762 2022 7.62
平均評価: / 5 ( 件のレビュー)