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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 ページ PKVアクセス数
1761 A Prognostic Model for Stochastic Degrading Systems With State Recovery: Application to Li-Ion Batteries
Zheng-Xin Zhang, Xiao-Sheng Si, Chang-Hua Hu, Michael G. Pecht IEEE Transactions on Reliability 66 4 1293–1308 2017 3.81
平均評価: / 5 ( 件のレビュー)
1762 Locally Linear Embedding on Grassmann Manifold for Performance Degradation Assessment of Bearings
Meng Ma, Xuefeng Chen, Xiaoli Zhang, Baoqing Ding, Shibin Wang IEEE Transactions on Reliability 66 2 467–477 2017 3.81
平均評価: / 5 ( 件のレビュー)
1763 Robust Particle Filters for Fatigue Crack Growth Estimation in Rotorcraft Structures
Mulugeta A. Haile, Jaret C. Riddick, Abey H. Assefa IEEE Transactions on Reliability 65 3 1438–1448 2016 3.81
平均評価: / 5 ( 件のレビュー)
1764 Failure Mode and Effect Analysis Under Uncertainty: An Integrated Multiple Criteria Decision Making Approach
Hu-Chen Liu, Jian-Xin You, Ping Li, Qiang Su IEEE Transactions on Reliability 65 3 1380–1392 2016 3.81
平均評価: / 5 ( 件のレビュー)
1765 A Stationary Grouping Maintenance Strategy Using Mean Residual Life and the Birnbaum Importance Measure for Complex Structures
Hai Canh Vu, Phuc Do, Anne Barros IEEE Transactions on Reliability 65 1 217–234 2016 3.81
平均評価: / 5 ( 件のレビュー)
1766 Reliability Computing Methods of Probabilistic Location Set Covering Problem Considering Wireless Network Applications
Zilong Feng, Hiroyuki Okamura, Tadashi Dohi, Won Young Yun IEEE Transactions on Reliability 73 1 290–303 2024 3.79
平均評価: / 5 ( 件のレビュー)
1767 Probabilistic Modeling of Variation in Pilot Performance During Flight Training
Kento Yamada, Harumi Ikeshita, Yuta Kyoya, Makoto Ueno IEEE Transactions on Reliability 73 1 451–462 2024 3.79
平均評価: / 5 ( 件のレビュー)
1768 AXI Lite Redundant On-Chip Bus Interconnect for High Reliability Systems
Jesús Lázaro, Armando Astarloa, Aitzol Zuloaga, José Ángel Araujo, Jaime Jiménez IEEE Transactions on Reliability 73 1 602–607 2024 3.79
平均評価: / 5 ( 件のレビュー)
1769 What's Wrong With Low-Code Development Platforms? An Empirical Study of Low-Code Development Platform Bugs
Dong Liu, He Jiang, Shikai Guo, Yuting Chen, Lei Qiao IEEE Transactions on Reliability 73 1 695–709 2024 3.79
平均評価: / 5 ( 件のレビュー)
1770 Two-Phase Adaptive Kriging Model Based Importance Sampling Method for Estimating Time-Dependent Failure Probability
Kaixuan Feng, Zhenzhou Lu, Nan Ye, Pengfei He, Ying Dai IEEE Transactions on Reliability 73 1 370–383 2024 3.79
平均評価: / 5 ( 件のレビュー)