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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
1761 Optimal Setting of Test Conditions and Allocation of Test Units for Accelerated Degradation Tests With Two Stress Variables
Guanqi Fang, Rong Pan, John Stufken IEEE Transactions on Reliability 70 3 1096–1111 2021 7.71
平均評価: / 5 ( 件のレビュー)
1762 Understanding How to Use Static Analysis Tools for Detecting Cryptography Misuse in Software
Alexandre Braga, Ricardo Dahab, Nuno Antunes, Nuno Laranjeiro, Marco Vieira IEEE Transactions on Reliability 68 4 1384–1403 2019 7.71
平均評価: / 5 ( 件のレビュー)
1763 Cross-Project and Within-Project Semisupervised Software Defect Prediction: A Unified Approach
Fei Wu, Xiao-Yuan Jing, Ying Sun, Jing Sun, Lin Huang, Fangyi Cui, Yanfei Sun IEEE Transactions on Reliability 67 2 581–597 2018 7.71
平均評価: / 5 ( 件のレビュー)
1764 Optimal Scheduling and Management on Correlating Reliability, Performance, and Energy Consumption for Multiagent Cloud Systems
Peng Sun, Yuanshun Dai, Xiwei Qiu IEEE Transactions on Reliability 66 2 547–558 2017 7.71
平均評価: / 5 ( 件のレビュー)
1765 Experiment-Based Reliability Analysis of Girth Welds on Different Grade Steel Pipelines
Wei Ren, Jian Shuai, Yuan Mei IEEE Transactions on Reliability 73 1 492–505 2024 7.7
平均評価: / 5 ( 件のレビュー)
1766 Implicit Reward Structures for Implicit Reliability Models
Giulio Masetti, Leonardo Robol, Silvano Chiaradonna, Felicita Di Giandomenico IEEE Transactions on Reliability 72 2 774–794 2023 7.7
平均評価: / 5 ( 件のレビュー)
1767 The Game of Spear and Shield in Next Era of Cybersecurity
Shanhsin Lee, Mengru Tsai, Shiuhpyng Winston Shieh IEEE Transactions on Reliability 73 1 83–84 2024 7.69
平均評価: / 5 ( 件のレビュー)
1768 Real-Time Evaluation of the Credibility of Remaining Useful Life Prediction Result
Guannan Shi, Xiaohong Zhang, Hui Shi, Jianchao Zeng, Yankai Qin, Haitao Liao IEEE Transactions on Reliability 73 3 1606–1618 2024 7.69
平均評価: / 5 ( 件のレビュー)
1769 LiteFormer: A Lightweight and Efficient Transformer for Rotating Machine Fault Diagnosis
Wenjun Sun, Ruqiang Yan, Ruibing Jin, Jiawen Xu, Yuan Yang, Zhenghua Chen IEEE Transactions on Reliability 73 2 1258–1269 2024 7.69
平均評価: / 5 ( 件のレビュー)
1770 Run-to-Failure Relay Dataset for Predictive Maintenance Research With Machine Learning
Fabian Winkel, Johannes Deuse-Kleinsteuber, Joachim Böcker IEEE Transactions on Reliability 73 1 101–114 2024 7.69
平均評価: / 5 ( 件のレビュー)