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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
1741 Likelihood Inference Under Proportional Hazards Model for One-Shot Device Testing
Man Ho Ling, Hon Yiu So, Narayanaswamy Balakrishnan IEEE Transactions on Reliability 65 1 446–458 2016 7.8
平均評価: / 5 ( 件のレビュー)
1742 Modeling and Analysis of Attacks and Counter Defense Mechanisms for Cyber Physical Systems
Robert Mitchell, Ing-Ray Chen IEEE Transactions on Reliability 65 1 350–358 2016 7.8
平均評価: / 5 ( 件のレビュー)
1743 The $g$-Good-Neighbor $r$-Component Diagnosability of Hypercube—Theoretical and Algorithmic Approaches
Yuankang Mao, Jiafei Liu, Sun-Yuan Hsieh, Jingli Wu, Gaoshi Li IEEE Transactions on Reliability 75 1 247–259 2026 7.79
平均評価: / 5 ( 件のレビュー)
1744 Optimization of Multilevel Inspection Strategy for Nonrepairable Multistate Systems
Yu Liu, Boyuan Zhang, Tao Jiang, Tangfan Xiahou IEEE Transactions on Reliability 69 3 968–985 2020 7.75
平均評価: / 5 ( 件のレビュー)
1745 Can Higher-Order Mutants Improve the Performance of Mutation-Based Fault Localization?
Haifeng Wang, Zheng Li, Yong Liu, Xiang Chen, Doyle Paul, Yuxiaoyang Cai, Luxi Fan IEEE Transactions on Reliability 71 2 1157–1173 2022 7.74
平均評価: / 5 ( 件のレビュー)
1746 Efficient Vulnerability Assessment of Large-Scale Dynamic Transportation Networks
Venkateswaran Shekar, Lance Fiondella IEEE Transactions on Reliability 74 2 2738–2750 2025 7.73
平均評価: / 5 ( 件のレビュー)
1747 Toward Learning Model-Agnostic Explanations for Deep Learning-Based Signal Modulation Classifiers
Yunzhe Tian, Dongyue Xu, Endong Tong, Rui Sun, Kang Chen, Yike Li, Thar Baker, Wenjia Niu, Jiqiang Liu IEEE Transactions on Reliability 73 3 1529–1543 2024 7.73
平均評価: / 5 ( 件のレビュー)
1748 Multi-Area Load Frequency Control in Power System Integrated With Wind Farms Using Fuzzy Generalized Predictive Control Method
Huimin Wang, Zhaojun Steven Li IEEE Transactions on Reliability 72 2 737–747 2023 7.73
平均評価: / 5 ( 件のレビュー)
1749 Modeling and Analysis of Cyber–Physical System Based on Object-Oriente Generalized Stochastic Petri Net
Haiyang Hu, Jiawei Yu, Zhongjin Li, Jie Chen, Hua Hu IEEE Transactions on Reliability 70 3 1271–1285 2021 7.73
平均評価: / 5 ( 件のレビュー)
1750 RTPDroid: Detecting Implicitly Malicious Behaviors Under Runtime Permission Model
Jie Zhang, Cong Tian, Zhenhua Duan, Liang Zhao IEEE Transactions on Reliability 70 3 1295–1308 2021 7.73
平均評価: / 5 ( 件のレビュー)