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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
1611 Which Coefficients Matter Most—Consecutive k-Out-of-n:F Systems Revisited
Vlad-Florin Drăgoi, Valeriu Beiu IEEE Transactions on Reliability 73 3 1633–1646 2024 8.6
平均評価: / 5 ( 件のレビュー)
1612 State of Knowledge Correlation in Failure Analysis of Mechatronics Systems
Pooja Singh, Lalit Kumar Singh IEEE Transactions on Reliability 72 1 240–247 2023 8.6
平均評価: / 5 ( 件のレビュー)
1613 Effective Covering Array Generation Using an Improved Particle Swarm Optimization
Zhao Li, Yuhang Chen, Yi Song, Kangjie Lu, Jinwei Shen IEEE Transactions on Reliability 71 1 284–294 2022 8.6
平均評価: / 5 ( 件のレビュー)
1614 Construction and Evaluation of a High-Quality Corpus for Legal Intelligence Using Semiautomated Approaches
Haihua Chen, Lavinia F. Pieptea, Junhua Ding IEEE Transactions on Reliability 71 2 657–673 2022 8.6
平均評価: / 5 ( 件のレビュー)
1615 Production Monitoring to Improve Test Suites
Deepika Tiwari, Long Zhang, Martin Monperrus, Benoit Baudry IEEE Transactions on Reliability 71 3 1381–1397 2022 8.6
平均評価: / 5 ( 件のレビュー)
1616 Prognostics Based on Stochastic Degradation Process: The Last Exit Time Perspective
Jian-Xun Zhang, Dang-Bo Du, Xiao-Sheng Si, Yang Liu, Chang-Hua Hu IEEE Transactions on Reliability 70 3 1158–1176 2021 8.6
平均評価: / 5 ( 件のレビュー)
1617 Diversity-Oriented Test Suite Generation for EFSM Model
Ruilian Zhao, Weiwei Wang, Yuqi Song, Zheng Li IEEE Transactions on Reliability 69 2 611–631 2020 8.6
平均評価: / 5 ( 件のレビュー)
1618 The Generalized Inflection S-Shaped Software Reliability Growth Model
Akash Deep, Dharmaraj Veeramani, Shiyu Zhou IEEE Transactions on Reliability 69 1 228–244 2020 8.6
平均評価: / 5 ( 件のレビュー)
1619 A Template-Based Methodology for the Specification and Automated Composition of Performability Models
Lechang Yang, Yanling Guo, Qiang Wang IEEE Transactions on Reliability 69 1 293–309 2020 8.6
平均評価: / 5 ( 件のレビュー)
1620 A New Subtraction-Based Algorithm for the d-MPs for All d Problem
Wei-Chang Yeh, Ming J. Zuo IEEE Transactions on Reliability 68 3 999–1008 2019 8.6
平均評価: / 5 ( 件のレビュー)