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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 ページ PKVアクセス数
1271 Collaborative Cloud-Controlled Defense Mechanism for Low-Carbon Economic Dispatch in Active Distribution Networks Under Interlayer Attack
Cong Cai, Yunfeng Wang, Qingyu Su, Jian Li IEEE Transactions on Reliability 74 2 2655–2667 2025 6.73
平均評価: / 5 ( 件のレビュー)
1272 Fault Detection Based on Causal Discovery and Graph Convolutional Network for Complex Mechatronic Systems
Chong Wang, Jie Liu IEEE Transactions on Reliability 74 1 2382–2393 2025 6.73
平均評価: / 5 ( 件のレビュー)
1273 Rethinking Software Fault Tolerance
Kishor S. Trivedi, Michael Grottke, Javier Alonso Lopez IEEE Transactions on Reliability 73 1 59–66 2024 6.73
平均評価: / 5 ( 件のレビュー)
1274 Container Rehandling Probability Prediction Model Based on Seq2Seq Network
Guojie Chen, Weidong Zhao, Xianhui Liu, Mingyue Wei IEEE Transactions on Reliability 73 3 1569–1580 2024 6.73
平均評価: / 5 ( 件のレビュー)
1275 Explainable Models for Multivariate Time-series Defect Classification of Arc Stud Welding
Sadra Naddaf Shargh, Mahdi Naddaf-Sh, Maxim Dalton, Soodabeh Ramezani, Amir R. Kashani, Hassan Zargarzadeh International Journal of Prognostics and Health Management 14 3 3125–None 2023 6.73
平均評価: / 5 ( 件のレビュー)
1276 Duplicate Bug Report Detection Using an Attention-Based Neural Language Model
Montassar Ben Messaoud, Asma Miladi, Ilyes Jenhani, Mohamed Wiem Mkaouer, Lobna Ghadhab IEEE Transactions on Reliability 72 2 846–858 2023 6.73
平均評価: / 5 ( 件のレビュー)
1277 Listening to Users' Voice: Automatic Summarization of Helpful App Reviews
Cuiyun Gao, Yaoxian Li, Shuhan Qi, Yang Liu, Xuan Wang, Zibin Zheng, Qing Liao IEEE Transactions on Reliability 72 4 1619–1631 2023 6.73
平均評価: / 5 ( 件のレビュー)
1278 Software Bug Number Prediction Based on Complex Network Theory and Panel Data Model
Shunkun Yang, Xiaodong Gou, Minghao Yang, Qi Shao, Chong Bian, Ming Jiang, Yongjie Qiao IEEE Transactions on Reliability 71 1 162–177 2022 6.73
平均評価: / 5 ( 件のレビュー)
1279 Approximate Safety Properties in Metric Transition Systems
Junyan Qian, Fan Shi, Yong Cai, Haiyu Pan IEEE Transactions on Reliability 71 1 221–234 2022 6.73
平均評価: / 5 ( 件のレビュー)
1280 On Existence of Common Malicious System Call Codes in Android Malware Families
Roopak Surendran, Tony Thomas, Sabu Emmanuel IEEE Transactions on Reliability 70 1 248–260 2021 6.73
平均評価: / 5 ( 件のレビュー)