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Quality and Reliability Engineering International - 巻 33 / 号 8

タイトル
著者 巻 号 ページ 年 PKV
Lifecycle risk assessment of a technological system using dynamic Bayesian networks
Maryam Ashrafi, Sadjad Anzabi Zadeh 33 8 2497–2520 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
The effects of violations of the multivariate normality assumption in multivariate Shewhart and MEWMA control charts
Sudarat Nidsunkid, John J. Borkowski, Kamon Budsaba 33 8 2563–2576 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Repeated SPRT charts for monitoring INAR(1) processes
Shangjie Xu, Daniel R. Jeske 33 8 2615–2624 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
On Bayesian EWMA control charts under different loss functions
Salma Riaz, Muhammad Riaz, Amna Nazeer, Zawar Hussain 33 8 2653–2665 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Reliability analysis for electronic devices using beta‐Weibull distribution
Luis Carlos Méndez‐González, Luis Alberto Rodríguez‐Picón, Delia Julieta Valles‐Rosales, Roberto Romero‐López, Abel Eduardo Quezada‐Carreón 33 8 2521–2530 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Classical and Bayesian inference on progressive‐stress accelerated life testing for the extension of the exponential distribution under progressive type‐II censoring
M.M. Mohie El‐Din, S.E. Abu‐Youssef, Nahid S.A. Ali, A.M. Abd El‐Raheem 33 8 2483–2496 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Reliability evaluation for wireless sensor networks with chain structures using the universal generating function
Qiang Liu, Xiao Yin, Xiao Yang, Yanbo Ma 33 8 2685–2698 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Time‐between‐events control charts for an exponentiated class of distributions of the renewal process
Sajid Ali 33 8 2625–2651 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Monitoring type‐2 censored reliability data in multistage processes
Shervisn Asadzadeh, Fatemeh Kiadaliry 33 8 2551–2561 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
An inspection model for a multi‐component system subject to 2 types of failures
Li Yang, Yu Zhao, Xiaobing Ma 33 8 2539–2549 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)