Reliability analysis for electronic devices using beta‐Weibull distribution
['Luis Carlos Méndez‐González', 'Luis Alberto Rodríguez‐Picón', 'Delia Julieta Valles‐Rosales', 'Roberto Romero‐López', 'Abel Eduardo Quezada‐Carreón']
/
Quality and Reliability Engineering International
/ Vol. 33
/ No. 8
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