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Journal of Quality Technology - 巻 57 / 号 5

タイトル
著者 巻 号 ページ 年 PKV
Profile monitoring via a nonparametric Bayesian online learning framework: Application to wafer map data in the semiconductor manufacturing industry
Daewon Yang, Jinsu Park, Hohyun Jung, Yeonseung Chung 57 5 415–439 2025 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Bayesian sequential I-optimal designs for split-plot experiments under model uncertainty
Yao Xiao, Po Yang, Na Zou 57 5 440–459 2025 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
An adaptive CUSUM chart for robust monitoring of multivariate processes
Xiulin Xie 57 5 398–414 2025 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
A task-incremental semi-supervised meta learning method for few-shot RUL prediction
Ying Wang, Feifan Wang, Di Wang, Nan Chen 57 5 460–475 2025 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Optimal coverage design for experiments with multiple types of factors
Taihe Yi, Zhengqiang Pan, Kai Chen 57 5 487–499 2025 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Bias in the Kaplan–Meier estimator for small samples
Yuxin Qin, Heather Sasinowska, Lawrence M. Leemis 57 5 476–486 2025 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
A new adaptive EWMA control chart based on Catoni’s function for monitoring process variability
Ruoyu Zhou, Lianjie Shu, Wenpo Huang, Yanting Li 57 5 383–397 2025 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Two-stage design for failure probability estimation with Gaussian process surrogates
Annie S. Booth, S. Ashwin Renganathan 57 5 500–516 2025 0.0
平均評価: 0.0 / 5 (0 件のレビュー)