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An EWMA-type sign chart with exact run length properties
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P. Castagliola, K. P. Tran, G. Celano, A. C. Rakitzis, P. E. Maravelakis
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51 |
1 |
51–63 |
2019 |
11.88 |
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平均評価: 0.0 / 5
(0 件のレビュー)
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An integer linear programing approach to find trend-robust run orders of experimental designs
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José Núñez Ares, Peter Goos
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51 |
1 |
37–50 |
2019 |
10.88 |
|
平均評価: 0.0 / 5
(0 件のレビュー)
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A new variable selection method based on SVM for analyzing supersaturated designs
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Krystallenia Drosou, Christos Koukouvinos
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51 |
1 |
21–36 |
2019 |
7.0 |
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平均評価: 0.0 / 5
(0 件のレビュー)
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Estimation of the random error of binary tests using adaptive polynomials
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Thomas S. Akkerhuis, Jeroen de Mast, Tashi P. Erdmann
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51 |
1 |
81–93 |
2019 |
5.88 |
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平均評価: 0.0 / 5
(0 件のレビュー)
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Strategic allocation of test units in an accelerated degradation test plan
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Zhi-Sheng Ye, Qingpei Hu, Dan Yu
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51 |
1 |
64–80 |
2019 |
5.0 |
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平均評価: 0.0 / 5
(0 件のレビュー)
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Critical fault-detecting time evaluation in software with discrete compound Poisson models
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Min-Hsiung Hsieh, Shuen-Lin Jeng, Paul Kvam
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51 |
1 |
94–108 |
2019 |
4.92 |
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平均評価: 0.0 / 5
(0 件のレビュー)
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Identifying and visualizing part-to-part variation with spatially dense optical dimensional metrology data
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Zhenyu Shi, Daniel W. Apley, George C. Runger
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51 |
1 |
3–20 |
2019 |
3.0 |
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平均評価: 0.0 / 5
(0 件のレビュー)
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