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Journal of Quality Technology - 巻 51 / 号 1

タイトル
著者 巻 号 ページ 年 PKV
A new variable selection method based on SVM for analyzing supersaturated designs
Krystallenia Drosou, Christos Koukouvinos 51 1 21–36 2019 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Critical fault-detecting time evaluation in software with discrete compound Poisson models
Min-Hsiung Hsieh, Shuen-Lin Jeng, Paul Kvam 51 1 94–108 2019 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
An EWMA-type sign chart with exact run length properties
P. Castagliola, K. P. Tran, G. Celano, A. C. Rakitzis, P. E. Maravelakis 51 1 51–63 2019 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
An integer linear programing approach to find trend-robust run orders of experimental designs
José Núñez Ares, Peter Goos 51 1 37–50 2019 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Strategic allocation of test units in an accelerated degradation test plan
Zhi-Sheng Ye, Qingpei Hu, Dan Yu 51 1 64–80 2019 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Estimation of the random error of binary tests using adaptive polynomials
Thomas S. Akkerhuis, Jeroen de Mast, Tashi P. Erdmann 51 1 81–93 2019 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Identifying and visualizing part-to-part variation with spatially dense optical dimensional metrology data
Zhenyu Shi, Daniel W. Apley, George C. Runger 51 1 3–20 2019 0.0
平均評価: 0.0 / 5 (0 件のレビュー)