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Journal of Manufacturing Science and Engineering - 巻 146 / 号 7

タイトル
著者 巻 号 ページ 年 PKV
Measurement of Thermal Field Temperature Distribution Inside Reaction Chamber for Epitaxial Growth of Silicon Carbide Layer
Shiwei Deng, Yancheng Wang, Jiafeng Cheng, Wenjie Shen, Deqing Mei 146 7 070901–None 2024 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Classification of Chip-Level Defect Types in Wafer Bin Maps Using Only Wafer-Level Labels
Hyuck Lee, Hyeonwoo Kim, Heeyoung Kim 146 7 070902–None 2024 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Few-Shot Classification of Wafer Bin Maps Using Transfer Learning and Ensemble Learning
Hyeonwoo Kim, Heegeon Yoon, Heeyoung Kim 146 7 070903–None 2024 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Auto-Labeling for Pattern Recognition of Wafer Defect Maps in Semiconductor Manufacturing
Shu-Kai S. Fan, Pei-Chen Chen, Chih-Hung Jen, Kanchana Sethanan 146 7 070904–None 2024 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Hole Edge Metrology and Inspection by Edge Diffractometry
Kuan Lu, ChaBum Lee 146 7 070905–None 2024 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Hybrid Semiconductor Wafer Inspection Framework via Autonomous Data Annotation
Changheon Han, Heebum Chun, Jiho Lee, Fengfeng Zhou, Huitaek Yun, ChaBum Lee, Martin B.G. Jun 146 7 070906–None 2024 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Three-Dimensional Profile Reconstruction and Internal Defect Detection of Silicon Wafers Using Cascaded Fiber Optic Fabry–Pérot Interferometer and Leaky Field Detection Technologies
Fengfeng Zhou, Xingyu Fu, Siying Chen, Changheon Han, Martin B. G. Jun 146 7 070907–None 2024 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Wafer Edge Metrology and Inspection Technique Using Curved-Edge Diffractive Fringe Pattern Analysis
Kuan Lu, Zhikun Wang, Heebum Chun, ChaBum Lee 146 7 070908–None 2024 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Investigation of Fiber Orientation of Fused Filament Fabricated CFRP Composites via an External Magnetic Field
Haoran Zhang, Kaifeng Wang 146 7 071001–None 2024 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Multi-Pass Laser Polishing of As-Built Directed Energy Deposition Surfaces
Arpan Patel, Samantha Webster, Jian Cao, Kornel Ehmann 146 7 071002–None 2024 0.0
平均評価: 0.0 / 5 (0 件のレビュー)