アクセスランキング（PKV）
| 順位 | タイトル | ||||||||
|---|---|---|---|---|---|---|---|---|---|
| 著者 | 雑誌 | 巻 | 号 | ページ | 年 | PKVアクセス数 | |||
| 6061 | Maintenance Scheduling for Multicomponent Systems with Hidden Failures | ||||||||
| Bin Liu, Ruey-Huei Yeh, Min Xie, Way Kuo | IEEE Transactions on Reliability | 66 | 4 | 1280–1292 | 2017 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 6062 | A Prognostic Model for Stochastic Degrading Systems With State Recovery: Application to Li-Ion Batteries | ||||||||
| Zheng-Xin Zhang, Xiao-Sheng Si, Chang-Hua Hu, Michael G. Pecht | IEEE Transactions on Reliability | 66 | 4 | 1293–1308 | 2017 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 6063 | Maintenance Strategy Optimization for Complex Power Systems Susceptible to Maintenance Delays and Operational Dynamics | ||||||||
| Hindolo George-Williams, Edoardo Patelli | IEEE Transactions on Reliability | 66 | 4 | 1309–1330 | 2017 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 6064 | Statistical Modeling of Bearing Degradation Signals | ||||||||
| Dong Wang, Kwok-Leung Tsui | IEEE Transactions on Reliability | 66 | 4 | 1331–1344 | 2017 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 6065 | Two-Phase Degradation Process Model With Abrupt Jump at Change Point Governed by Wiener Process | ||||||||
| Dejing Kong, Narayanaswamy Balakrishnan, Lirong Cui | IEEE Transactions on Reliability | 66 | 4 | 1345–1360 | 2017 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 6066 | Online Estimation Methods for the Gamma Degradation Process | ||||||||
| Christian Paroissin | IEEE Transactions on Reliability | 66 | 4 | 1361–1367 | 2017 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 6067 | Remaining Useful Life Prediction for Degradation Processes With Long-Range Dependence | ||||||||
| Hanwen Zhang, Maoyin Chen, Xiaopeng Xi, Donghua Zhou | IEEE Transactions on Reliability | 66 | 4 | 1368–1379 | 2017 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 6068 | A Scalable Solution to Soft Error Tolerant Circuit Design Using Partitioning-Based Gate Sizing | ||||||||
| Mohamad Imran Bandan, Samuel Pagliarini, Jimson Mathew, Dhiraj Pradhan | IEEE Transactions on Reliability | 66 | 1 | 245–256 | 2017 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 6069 | Improved Multiple Faults-Aware Placement Strategy: Reducing the Overheads and Error Rates in Digital Circuits | ||||||||
| Büşra Keleş, Salih Tekin, Niyazi Onur Bakır | IEEE Transactions on Reliability | 66 | 1 | 233–244 | 2017 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 6070 | Optimal Periodic Inspections and Activation Sequencing Policy in Standby Systems With Condition-Based Mode Transfer | ||||||||
| Zhenxu Zhou, Qin Zhang | IEEE Transactions on Reliability | 66 | 1 | 189–201 | 2017 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||