Powered by Engineering Brain, Japan | What is PKV? | PKV Methodology | KnowledgeRank v4.0.0: PKV Trends of My Authored Papers Are Now Available on My Page

アクセスランキング(PKV)

順位 タイトル
著者 雑誌 ページ PKVアクセス数
5241 Reliability Analysis via Non-Gaussian State-Space Models
Thiago Rezende dos Santos, Dani Gamerman, Glaura da Conceição Franco IEEE Transactions on Reliability 66 2 309–318 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5242 Reliability Analysis of Ethernet Ring Mesh Networks
Fathollah Bistouni, Mohsen Jahanshahi IEEE Transactions on Reliability 66 4 1238–1252 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5243 Dynamic Defense Resource Allocation for Minimizing Unsupplied Demand in Cyber-Physical Systems Against Uncertain Attacks
Huadong Mo, Giovanni Sansavini IEEE Transactions on Reliability 66 4 1253–1265 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5244 Dynamic Reliability Assessment for Nonrepairable Multistate Systems by Aggregating Multilevel Imperfect Inspection Data
Yu Liu, Chu-Jie Chen IEEE Transactions on Reliability 66 2 281–297 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5245 Maintenance Scheduling for Multicomponent Systems with Hidden Failures
Bin Liu, Ruey-Huei Yeh, Min Xie, Way Kuo IEEE Transactions on Reliability 66 4 1280–1292 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5246 A Prognostic Model for Stochastic Degrading Systems With State Recovery: Application to Li-Ion Batteries
Zheng-Xin Zhang, Xiao-Sheng Si, Chang-Hua Hu, Michael G. Pecht IEEE Transactions on Reliability 66 4 1293–1308 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5247 Maintenance Strategy Optimization for Complex Power Systems Susceptible to Maintenance Delays and Operational Dynamics
Hindolo George-Williams, Edoardo Patelli IEEE Transactions on Reliability 66 4 1309–1330 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5248 Statistical Modeling of Bearing Degradation Signals
Dong Wang, Kwok-Leung Tsui IEEE Transactions on Reliability 66 4 1331–1344 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5249 Two-Phase Degradation Process Model With Abrupt Jump at Change Point Governed by Wiener Process
Dejing Kong, Narayanaswamy Balakrishnan, Lirong Cui IEEE Transactions on Reliability 66 4 1345–1360 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)
5250 Online Estimation Methods for the Gamma Degradation Process
Christian Paroissin IEEE Transactions on Reliability 66 4 1361–1367 2017 1.0
平均評価: 0.0 / 5 (0 件のレビュー)