21531
PBGC: Proxy Block-Based Garbage Collection for Index Structures in NAND Flash Memory
Seon Hwan KIM, Ju Hee CHOI, Jong Wook KWAK
IEICE Transactions in Information and Systems
99
7
1928–1932
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
21532
Computationally Efficient Class-Prior Estimation under Class Balance Change Using Energy Distance
Hideko KAWAKUBO, Marthinus Christoffel DU PLESSIS, Masashi SUGIYAMA
IEICE Transactions in Information and Systems
99
1
176–186
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
21533
Quantitative Assessment of Facial Paralysis Based on Spatiotemporal Features
Truc Hung NGO, Yen-Wei CHEN, Naoki MATSUSHIRO, Masataka SEO
IEICE Transactions in Information and Systems
99
1
187–196
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
21534
Part-Segment Features with Optimized Shape Priors for Articulated Pose Estimation
Norimichi UKITA
IEICE Transactions in Information and Systems
99
1
248–256
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
21535
Multiple-Object Tracking in Large-Scale Scene
Wenbo YUAN, Zhiqiang CAO, Min TAN, Hongkai CHEN
IEICE Transactions in Information and Systems
99
7
1903–1909
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
21536
Haptic Rendering of Curved Surface by Bending an Encountered-Type Flexible Plate
Seokhee JEON
IEICE Transactions in Information and Systems
99
7
1862–1870
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
21537
API-Based Software Birthmarking Method Using Fuzzy Hashing
Donghoon LEE, Dongwoo KANG, Younsung CHOI, Jiye KIM, Dongho WON
IEICE Transactions in Information and Systems
99
7
1836–1851
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
21538
Development of Tactile Graph Generation Web Application Using R Statistics Software Environment
Tetsuya WATANABE, Kosuke ARAKI, Toshimitsu YAMAGUCHI, Kazunori MINATAN ...
IEICE Transactions in Information and Systems
99
8
2151–2160
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
21539
A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides
Seong-Joon Kim, Tao Yuan, Suk Joo Bae
IEEE Transactions on Reliability
65
1
263–271
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
21540
Optical Degradation Mechanisms of Indium Gallium Nitride-Based White Light Emitting Diodes by High-Temperature Aging Tests
Yi-Jun Lu, Zi-Quan Guo, Tien-Mo Shih, Yu-Lin Gao, Wei-Lin Huang, Hong-Li Lu, Yue Lin, Zhong Chen
IEEE Transactions on Reliability
65
1
256–262
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)