Optical Degradation Mechanisms of Indium Gallium Nitride-Based White Light Emitting Diodes by High-Temperature Aging Tests
['Yi-Jun Lu', 'Zi-Quan Guo', 'Tien-Mo Shih', 'Yu-Lin Gao', 'Wei-Lin Huang', 'Hong-Li Lu', 'Yue Lin', 'Zhong Chen']
/
IEEE Transactions on Reliability
/ Vol. 65
/ No. 1
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