アクセスランキング（PKV）
| 順位 | タイトル | ||||||||
|---|---|---|---|---|---|---|---|---|---|
| 著者 | 雑誌 | 巻 | 号 | ページ | 年 | PKVアクセス数 | |||
| 19441 | Optical Degradation Mechanisms of Indium Gallium Nitride-Based White Light Emitting Diodes by High-Temperature Aging Tests | ||||||||
| Yi-Jun Lu, Zi-Quan Guo, Tien-Mo Shih, Yu-Lin Gao, Wei-Lin Huang, Hong-Li Lu, Yue Lin, Zhong Chen | IEEE Transactions on Reliability | 65 | 1 | 256–262 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 19442 | A Novel Layout-Based Single Event Transient Injection Approach to Evaluate the Soft Error Rate of Large Combinational Circuits in Complimentary Metal-Oxide-Semiconductor Bulk Technology | ||||||||
| Yankang Du, Shuming Chen | IEEE Transactions on Reliability | 65 | 1 | 248–255 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 19443 | Age-Based Replacement Policy With Consideration of Production Wait Time | ||||||||
| Ping Li, Wenbin Wang, Rui Peng | IEEE Transactions on Reliability | 65 | 1 | 235–247 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 19444 | A Comparison of Alloy-Surface Finish Combinations Considering Different Component Package Types and Their Impact on Soldering Reliability | ||||||||
| Rossella Berni, Marcantonio Catelani, Caterina Fiesoli, Valeria L. Scarano | IEEE Transactions on Reliability | 65 | 1 | 272–281 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 19445 | Intelligent Condition Based Monitoring Using Acoustic Signals for Air Compressors | ||||||||
| Nishchal K. Verma, Rahul Kumar Sevakula, Sonal Dixit, Al Salour | IEEE Transactions on Reliability | 65 | 1 | 291–309 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 19446 | A New Degradation Indicator Based on a Statistical Anomaly Approach | ||||||||
| João Paulo Pordeus Gomes, Roberto Kawakami Harrop Galvão, Takashi Yoneyama, Bruno P. Leão | IEEE Transactions on Reliability | 65 | 1 | 326–335 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 19447 | A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides | ||||||||
| Seong-Joon Kim, Tao Yuan, Suk Joo Bae | IEEE Transactions on Reliability | 65 | 1 | 263–271 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 19448 | A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes Under Competing Risks | ||||||||
| Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling | IEEE Transactions on Reliability | 65 | 1 | 469–485 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 19449 | Joint Particle Filters Prognostics for Proton Exchange Membrane Fuel Cell Power Prediction at Constant Current Solicitation | ||||||||
| Marine Jouin, Rafael Gouriveau, Daniel Hissel, Marie-Cécile Péra, Noureddine Zerhouni | IEEE Transactions on Reliability | 65 | 1 | 336–349 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 19450 | 大気圧プラズマ溶射によるMCrAlY皮膜の高温酸化特性 | ||||||||
| 水津 竜夫, 西迫 駿, 荒井 正行 | 材料 | 65 | 10 | 700–705 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||