14601
Optical Degradation Mechanisms of Indium Gallium Nitride-Based White Light Emitting Diodes by High-Temperature Aging Tests
Yi-Jun Lu, Zi-Quan Guo, Tien-Mo Shih, Yu-Lin Gao, Wei-Lin Huang, Hong-Li Lu, Yue Lin, Zhong Chen
IEEE Transactions on Reliability
65
1
256–262
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
14602
A Novel Layout-Based Single Event Transient Injection Approach to Evaluate the Soft Error Rate of Large Combinational Circuits in Complimentary Metal-Oxide-Semiconductor Bulk Technology
Yankang Du, Shuming Chen
IEEE Transactions on Reliability
65
1
248–255
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
14603
Joint Particle Filters Prognostics for Proton Exchange Membrane Fuel Cell Power Prediction at Constant Current Solicitation
Marine Jouin, Rafael Gouriveau, Daniel Hissel, Marie-Cécile Péra, Noureddine Zerhouni
IEEE Transactions on Reliability
65
1
336–349
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
14604
Age-Based Replacement Policy With Consideration of Production Wait Time
Ping Li, Wenbin Wang, Rui Peng
IEEE Transactions on Reliability
65
1
235–247
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
14605
A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes Under Competing Risks
Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling
IEEE Transactions on Reliability
65
1
469–485
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
14606
A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides
Seong-Joon Kim, Tao Yuan, Suk Joo Bae
IEEE Transactions on Reliability
65
1
263–271
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
14607
A Comparison of Alloy-Surface Finish Combinations Considering Different Component Package Types and Their Impact on Soldering Reliability
Rossella Berni, Marcantonio Catelani, Caterina Fiesoli, Valeria L. Scarano
IEEE Transactions on Reliability
65
1
272–281
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
14608
Intelligent Condition Based Monitoring Using Acoustic Signals for Air Compressors
Nishchal K. Verma, Rahul Kumar Sevakula, Sonal Dixit, Al Salour
IEEE Transactions on Reliability
65
1
291–309
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
14609
A New Degradation Indicator Based on a Statistical Anomaly Approach
João Paulo Pordeus Gomes, Roberto Kawakami Harrop Galvão, Takashi Yoneyama, Bruno P. Leão
IEEE Transactions on Reliability
65
1
326–335
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
14610
Global Sensitivity Analysis applied to Model Inversion Problems: A Contribution to Rail Condition Monitoring
René Schenkendorf, J¨orn C. Groos
International Journal of Prognostics and Health Management
6
4
2322–None
2015
1.0
平均評価: 0.0 / 5
(0 件のレビュー)