14011
Joint Particle Filters Prognostics for Proton Exchange Membrane Fuel Cell Power Prediction at Constant Current Solicitation
Marine Jouin, Rafael Gouriveau, Daniel Hissel, Marie-Cécile Péra, Noureddine Zerhouni
IEEE Transactions on Reliability
65
1
336–349
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
14012
A New Degradation Indicator Based on a Statistical Anomaly Approach
João Paulo Pordeus Gomes, Roberto Kawakami Harrop Galvão, Takashi Yoneyama, Bruno P. Leão
IEEE Transactions on Reliability
65
1
326–335
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
14013
A Shock Model Based Approach to Network Reliability
Somayeh Zarezadeh, Somayeh Ashrafi, Majid Asadi
IEEE Transactions on Reliability
65
2
992–1000
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
14014
Intelligent Condition Based Monitoring Using Acoustic Signals for Air Compressors
Nishchal K. Verma, Rahul Kumar Sevakula, Sonal Dixit, Al Salour
IEEE Transactions on Reliability
65
1
291–309
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
14015
A New Algorithm for Generating All Minimal Vectors for the q SMPs Reliability Problem With Time and Budget Constraints
Majid Forghani-elahabad, Nezam Mahdavi-Amiri
IEEE Transactions on Reliability
65
2
828–842
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
14016
A Comparison of Alloy-Surface Finish Combinations Considering Different Component Package Types and Their Impact on Soldering Reliability
Rossella Berni, Marcantonio Catelani, Caterina Fiesoli, Valeria L. Scarano
IEEE Transactions on Reliability
65
1
272–281
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
14017
A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides
Seong-Joon Kim, Tao Yuan, Suk Joo Bae
IEEE Transactions on Reliability
65
1
263–271
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
14018
Optical Degradation Mechanisms of Indium Gallium Nitride-Based White Light Emitting Diodes by High-Temperature Aging Tests
Yi-Jun Lu, Zi-Quan Guo, Tien-Mo Shih, Yu-Lin Gao, Wei-Lin Huang, Hong-Li Lu, Yue Lin, Zhong Chen
IEEE Transactions on Reliability
65
1
256–262
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
14019
A Novel Layout-Based Single Event Transient Injection Approach to Evaluate the Soft Error Rate of Large Combinational Circuits in Complimentary Metal-Oxide-Semiconductor Bulk Technology
Yankang Du, Shuming Chen
IEEE Transactions on Reliability
65
1
248–255
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
14020
Age-Based Replacement Policy With Consideration of Production Wait Time
Ping Li, Wenbin Wang, Rui Peng
IEEE Transactions on Reliability
65
1
235–247
2016
1.0
平均評価: 0.0 / 5
(0 件のレビュー)