アクセスランキング（PKV）
| 順位 | タイトル | ||||||||
|---|---|---|---|---|---|---|---|---|---|
| 著者 | 雑誌 | 巻 | 号 | ページ | 年 | PKVアクセス数 | |||
| 13411 | Inference for the Wiener Process With Random Initiation Time | ||||||||
| Christian Paroissin | IEEE Transactions on Reliability | 65 | 1 | 147–157 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 13412 | A comment on the beta hazard rate distribution | ||||||||
| Saralees Nadarajah | IEEE Transactions on Reliability | 65 | 1 | 158–158 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 13413 | Optimal Long-Run Imperfect Maintenance With Asymptotic Virtual Age | ||||||||
| Ji Hwan Cha, Maxim Finkelstein | IEEE Transactions on Reliability | 65 | 1 | 187–196 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 13414 | First and Last Triggering Event Approaches for Replacement With Minimal Repairs | ||||||||
| Xufeng Zhao, Khalifa N. Al-Khalifa, Abdel Magid Hamouda, Toshio Nakagawa | IEEE Transactions on Reliability | 65 | 1 | 197–207 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 13415 | A Stationary Grouping Maintenance Strategy Using Mean Residual Life and the Birnbaum Importance Measure for Complex Structures | ||||||||
| Hai Canh Vu, Phuc Do, Anne Barros | IEEE Transactions on Reliability | 65 | 1 | 217–234 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 13416 | Age-Based Replacement Policy With Consideration of Production Wait Time | ||||||||
| Ping Li, Wenbin Wang, Rui Peng | IEEE Transactions on Reliability | 65 | 1 | 235–247 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 13417 | A Novel Layout-Based Single Event Transient Injection Approach to Evaluate the Soft Error Rate of Large Combinational Circuits in Complimentary Metal-Oxide-Semiconductor Bulk Technology | ||||||||
| Yankang Du, Shuming Chen | IEEE Transactions on Reliability | 65 | 1 | 248–255 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 13418 | Optical Degradation Mechanisms of Indium Gallium Nitride-Based White Light Emitting Diodes by High-Temperature Aging Tests | ||||||||
| Yi-Jun Lu, Zi-Quan Guo, Tien-Mo Shih, Yu-Lin Gao, Wei-Lin Huang, Hong-Li Lu, Yue Lin, Zhong Chen | IEEE Transactions on Reliability | 65 | 1 | 256–262 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 13419 | A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides | ||||||||
| Seong-Joon Kim, Tao Yuan, Suk Joo Bae | IEEE Transactions on Reliability | 65 | 1 | 263–271 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 13420 | A Comparison of Alloy-Surface Finish Combinations Considering Different Component Package Types and Their Impact on Soldering Reliability | ||||||||
| Rossella Berni, Marcantonio Catelani, Caterina Fiesoli, Valeria L. Scarano | IEEE Transactions on Reliability | 65 | 1 | 272–281 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||