アクセスランキング（PKV）
| 順位 | タイトル | ||||||||
|---|---|---|---|---|---|---|---|---|---|
| 著者 | 雑誌 | 巻 | 号 | ページ | 年 | PKVアクセス数 | |||
| 13051 | General (N,T,τ) Opportunistic Maintenance for Multicomponent Systems With Evident and Hidden Failures | ||||||||
| Lu Zhao, Maoyin Chen, Donghua Zhou | IEEE Transactions on Reliability | 65 | 3 | 1298–1313 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 13052 | Maintenance Policy for a System With Stochastically Dependent Failure Modes With Shock-Accumulation Effect | ||||||||
| Ji Hwan Cha, Carmen Sangüesa, Inmaculada Torres Castro | IEEE Transactions on Reliability | 65 | 3 | 1284–1297 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 13053 | Reliability and Maintenance Models for a Competing-Risk System Subjected to Random Usage | ||||||||
| Kamyar Sabri-Laghaie, Rassoul Noorossana | IEEE Transactions on Reliability | 65 | 3 | 1271–1283 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 13054 | New Method in Searching for All Minimal Paths for the Directed Acyclic Network Reliability Problem | ||||||||
| Wei-Chang Yeh | IEEE Transactions on Reliability | 65 | 3 | 1263–1270 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 13055 | Age-Based Replacement Policy With Consideration of Production Wait Time | ||||||||
| Ping Li, Wenbin Wang, Rui Peng | IEEE Transactions on Reliability | 65 | 1 | 235–247 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 13056 | A Novel Layout-Based Single Event Transient Injection Approach to Evaluate the Soft Error Rate of Large Combinational Circuits in Complimentary Metal-Oxide-Semiconductor Bulk Technology | ||||||||
| Yankang Du, Shuming Chen | IEEE Transactions on Reliability | 65 | 1 | 248–255 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 13057 | Optical Degradation Mechanisms of Indium Gallium Nitride-Based White Light Emitting Diodes by High-Temperature Aging Tests | ||||||||
| Yi-Jun Lu, Zi-Quan Guo, Tien-Mo Shih, Yu-Lin Gao, Wei-Lin Huang, Hong-Li Lu, Yue Lin, Zhong Chen | IEEE Transactions on Reliability | 65 | 1 | 256–262 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 13058 | A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides | ||||||||
| Seong-Joon Kim, Tao Yuan, Suk Joo Bae | IEEE Transactions on Reliability | 65 | 1 | 263–271 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 13059 | A Comparison of Alloy-Surface Finish Combinations Considering Different Component Package Types and Their Impact on Soldering Reliability | ||||||||
| Rossella Berni, Marcantonio Catelani, Caterina Fiesoli, Valeria L. Scarano | IEEE Transactions on Reliability | 65 | 1 | 272–281 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 13060 | The Extra Connectivity, Extra Conditional Diagnosability, and t/m-Diagnosability of Arrangement Graphs | ||||||||
| Li Xu, Limei Lin, Shuming Zhou, Sun-Yuan Hsieh | IEEE Transactions on Reliability | 65 | 3 | 1248–1262 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||