アクセスランキング（PKV）
| 順位 | タイトル | ||||||||
|---|---|---|---|---|---|---|---|---|---|
| 著者 | 雑誌 | 巻 | 号 | ページ | 年 | PKVアクセス数 | |||
| 12251 | Reliability of Systems With Multiple Types of Dependent Components | ||||||||
| Serkan Eryilmaz | IEEE Transactions on Reliability | 65 | 2 | 1022–1029 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 12252 | Dynamic Uncertain Causality Graph Applied to Dynamic Fault Diagnoses and Predictions With Negative Feedbacks | ||||||||
| Qin Zhang, Zhan Zhang | IEEE Transactions on Reliability | 65 | 2 | 1030–1044 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 12253 | Reliability Analysis and Redundancy Allocation for a One-Shot System Containing Multifunctional Components | ||||||||
| Yiwen Xu, Haitao Liao | IEEE Transactions on Reliability | 65 | 2 | 1045–1057 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 12254 | An Extreme-Value Event Approach for Frequency-Domain Performance Reliability | ||||||||
| Gordon J. Savage, Young Kap Son | IEEE Transactions on Reliability | 65 | 2 | 1058–1068 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 12255 | Reliability Impact of Dynamic Thermal Rating System in Wind Power Integrated Network | ||||||||
| Jiashen Teh, Ian Cotton | IEEE Transactions on Reliability | 65 | 2 | 1081–1089 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 12256 | Web Service Personalized Quality of Service Prediction via Reputation-Based Matrix Factorization | ||||||||
| Jianlong Xu, Zibin Zheng, Michael R. Lyu | IEEE Transactions on Reliability | 65 | 1 | 28–37 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 12257 | Degradation Modeling Based on a Time-Dependent Ornstein-Uhlenbeck Process and Residual Useful Lifetime Estimation | ||||||||
| Yingjun Deng, Anne Barros, Antoine Grall | IEEE Transactions on Reliability | 65 | 1 | 126–140 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 12258 | Age-Based Replacement Policy With Consideration of Production Wait Time | ||||||||
| Ping Li, Wenbin Wang, Rui Peng | IEEE Transactions on Reliability | 65 | 1 | 235–247 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 12259 | A Novel Layout-Based Single Event Transient Injection Approach to Evaluate the Soft Error Rate of Large Combinational Circuits in Complimentary Metal-Oxide-Semiconductor Bulk Technology | ||||||||
| Yankang Du, Shuming Chen | IEEE Transactions on Reliability | 65 | 1 | 248–255 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 12260 | Optical Degradation Mechanisms of Indium Gallium Nitride-Based White Light Emitting Diodes by High-Temperature Aging Tests | ||||||||
| Yi-Jun Lu, Zi-Quan Guo, Tien-Mo Shih, Yu-Lin Gao, Wei-Lin Huang, Hong-Li Lu, Yue Lin, Zhong Chen | IEEE Transactions on Reliability | 65 | 1 | 256–262 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||