アクセスランキング（PKV）
| 順位 | タイトル | ||||||||
|---|---|---|---|---|---|---|---|---|---|
| 著者 | 雑誌 | 巻 | 号 | ページ | 年 | PKVアクセス数 | |||
| 11481 | A Cumulative-Exposure-Based Algorithm for Failure Data From a Load-Sharing System | ||||||||
| Yaonan Kong, Zhi-Sheng Ye | IEEE Transactions on Reliability | 65 | 2 | 1001–1013 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 11482 | Relative Ageing of Series and Parallel Systems With Statistically Independent and Heterogeneous Component Lifetimes | ||||||||
| Chen Li, Xiaohu Li | IEEE Transactions on Reliability | 65 | 2 | 1014–1021 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 11483 | Dynamic Uncertain Causality Graph Applied to Dynamic Fault Diagnoses and Predictions With Negative Feedbacks | ||||||||
| Qin Zhang, Zhan Zhang | IEEE Transactions on Reliability | 65 | 2 | 1030–1044 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 11484 | Reliability Impact of Dynamic Thermal Rating System in Wind Power Integrated Network | ||||||||
| Jiashen Teh, Ian Cotton | IEEE Transactions on Reliability | 65 | 2 | 1081–1089 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 11485 | Web Service Personalized Quality of Service Prediction via Reputation-Based Matrix Factorization | ||||||||
| Jianlong Xu, Zibin Zheng, Michael R. Lyu | IEEE Transactions on Reliability | 65 | 1 | 28–37 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 11486 | Detecting and Removing Web Application Vulnerabilities with Static Analysis and Data Mining | ||||||||
| Ibéria Medeiros, Nuno Neves, Miguel Correia | IEEE Transactions on Reliability | 65 | 1 | 54–69 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 11487 | Degradation Modeling Based on a Time-Dependent Ornstein-Uhlenbeck Process and Residual Useful Lifetime Estimation | ||||||||
| Yingjun Deng, Anne Barros, Antoine Grall | IEEE Transactions on Reliability | 65 | 1 | 126–140 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 11488 | A Comparison of Alloy-Surface Finish Combinations Considering Different Component Package Types and Their Impact on Soldering Reliability | ||||||||
| Rossella Berni, Marcantonio Catelani, Caterina Fiesoli, Valeria L. Scarano | IEEE Transactions on Reliability | 65 | 1 | 272–281 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 11489 | A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides | ||||||||
| Seong-Joon Kim, Tao Yuan, Suk Joo Bae | IEEE Transactions on Reliability | 65 | 1 | 263–271 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| 11490 | Optical Degradation Mechanisms of Indium Gallium Nitride-Based White Light Emitting Diodes by High-Temperature Aging Tests | ||||||||
| Yi-Jun Lu, Zi-Quan Guo, Tien-Mo Shih, Yu-Lin Gao, Wei-Lin Huang, Hong-Li Lu, Yue Lin, Zhong Chen | IEEE Transactions on Reliability | 65 | 1 | 256–262 | 2016 | 1.0 | |||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||