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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
911 Comparing Residual Lives and Inactivity Times by Transform Stochastic Orders
Antonio Arriaza, Miguel A. Sordo, Alfonso Suárez-Llorens IEEE Transactions on Reliability 66 2 366–372 2017 12.35
平均評価: / 5 ( 件のレビュー)
912 Detecting and Removing Web Application Vulnerabilities with Static Analysis and Data Mining
Ibéria Medeiros, Nuno Neves, Miguel Correia IEEE Transactions on Reliability 65 1 54–69 2016 12.35
平均評価: / 5 ( 件のレビュー)
913 Reliability Analysis of a Flow Network with a Series-Parallel-Reducible Structure
Jacek Malinowski IEEE Transactions on Reliability 65 2 851–859 2016 12.35
平均評価: / 5 ( 件のレビュー)
914 Probabilistic Prognosis with Dynamic Bayesian Networks
Gregory Bartram, Sankaran Mahadevan International Journal of Prognostics and Health Management 6 4 2290–None 2015 12.35
平均評価: / 5 ( 件のレビュー)
915 Reinforcement Learning-Boosted Event-Triggered Reliability Control for Uncertain CSTR System With Asymmetric Constraints
Jian Liu, Jiachen Ke, Jinliang Liu, Xiangpeng Xie, Engang Tian IEEE Transactions on Reliability 74 1 2069–2081 2025 12.34
平均評価: / 5 ( 件のレビュー)
916 A Novel Prognostics and Health Management Framework to Extract System Health Requirments in the Oil and Gas Industry
Khalid Alfahdi, Hakan Gultekin, Emad Summad International Journal of Prognostics and Health Management 15 2 3933–None 2024 12.33
平均評価: / 5 ( 件のレビュー)
917 Conformal Prediction Intervals for Remaining Useful Lifetime Estimation
Alireza Javanmardi, Eyke Hüllermeier International Journal of Prognostics and Health Management 14 2 3417–None 2023 12.33
平均評価: / 5 ( 件のレビュー)
918 Identifiable, But Not Visible: A Privacy-Preserving Person Reidentification Scheme
Bowen Zhao, Yingjiu Li, Ximeng Liu, Xiaoguo Li, Hwee Hwa Pang, Robert H. Deng IEEE Transactions on Reliability 72 4 1295–1307 2023 12.33
平均評価: / 5 ( 件のレビュー)
919 Parallel Batch Processing Machine Scheduling Under Two-Dimensional Bin-Packing Constraints
Xiaopan Zhang, Mengjie Shan, Ju Zeng IEEE Transactions on Reliability 72 3 1265–1275 2023 12.33
平均評価: / 5 ( 件のレビュー)
920 A Revisit of Age-Based Replacement Models With Exponential Failure Distributions
Xufeng Zhao, Butong Li, Satoshi Mizutani, Toshio Nakagawa IEEE Transactions on Reliability 71 4 1477–1487 2022 12.33
平均評価: / 5 ( 件のレビュー)