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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
871 Reliability and Availability Assessment
Kishor Trivedi IEEE Transactions on Reliability 73 1 15–16 2024 12.41
平均評価: / 5 ( 件のレビュー)
872 A Preliminary Investigation on the Performance of SBFL Techniques and Distance Metrics in Parallel Fault Localization
Yihao Li, Pan Liu IEEE Transactions on Reliability 71 2 803–817 2022 12.41
平均評価: / 5 ( 件のレビュー)
873 Tensor-Based Reliable Multiview Similarity Learning for Robust Spectral Clustering on Uncertain Data
Ao Li, Jiajia Chen, Deyun Chen, Xiaoyang Yu, Mengke Yuan, Shibiao Xu, Guanglu Sun IEEE Transactions on Reliability 70 3 916–930 2021 12.41
平均評価: / 5 ( 件のレビュー)
874 Transition Algebra for Software Testing
Pan Liu, Yihao Li, Huaikou Miao IEEE Transactions on Reliability 70 4 1438–1454 2021 12.41
平均評価: / 5 ( 件のレビュー)
875 An Approach for the Prediction of Number of Software Faults Based on the Dynamic Selection of Learning Techniques
Santosh Singh Rathore, Sandeep Kumar IEEE Transactions on Reliability 68 1 216–236 2019 12.41
平均評価: / 5 ( 件のレビュー)
876 Nonprobabilistic Reliability Evaluation for In-Service Gravity Dam Undergoing Structural Reinforcement
Huaizhi Su, Jinyou Li, Zhiyun Guo, Zhiping Wen IEEE Transactions on Reliability 67 3 970–986 2018 12.41
平均評価: / 5 ( 件のレビュー)
877 Reliability Assessment of Multiprocessor System Based on (n,k)-Star Network
Shuming Zhou, Xiaowang Li, Jinqiang Li, Dajin Wang IEEE Transactions on Reliability 66 4 1025–1035 2017 12.41
平均評価: / 5 ( 件のレビュー)
878 A Diversity Model Based on Failure Distribution and its Application in Safety Cases
Luping Chen, John H. R. May IEEE Transactions on Reliability 65 3 1149–1162 2016 12.41
平均評価: / 5 ( 件のレビュー)
879 EM Algorithm for One-Shot Device Testing With Competing Risks Under Weibull Distribution
Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling IEEE Transactions on Reliability 65 2 973–991 2016 12.41
平均評価: / 5 ( 件のレビュー)
880 Random-Effect Models for Degradation Analysis Based on Nonlinear Tweedie Exponential-Dispersion Processes
Zhen Chen, Tangbin Xia, Yaping Li, Ershun Pan IEEE Transactions on Reliability 71 1 47–62 2022 12.4
平均評価: / 5 ( 件のレビュー)