アクセスランキング（PKV）
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Jubilee Review: The 65 Years of the ASME Machine Design Award (1958–2023)
| 順位 | タイトル | ||||||||
|---|---|---|---|---|---|---|---|---|---|
| 著者 | 雑誌 | 巻 | 号 | ページ | 年 | PKVアクセス数 | |||
| 831 | Joint Domain Adaptation via Cluster Centers and Thermal Imaging for Detecting Leakages in Different Pneumatic Components | ||||||||
| Jiaqi Chang, Yan Shi, Lei Li, Jianchun Zhang, Yushan Ma, Maolin Cai, Xiangkai Shen, Yixuan Wang, Shaofeng Xu, Na Wang, Yanxia Niu, Wenjun Li, Liman Yang | IEEE Transactions on Reliability | 75 | 1 | 133–144 | 2026 | 9.33 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 832 | AMEE: Automatic Modulation Open Set Recognition Through Deep Metric Learning With Embedding Enhancement | ||||||||
| Dongwei Xu, Jiaye Hou, Fuxing Song, Zhuangzhi Chen, Shilian Zheng, Qi Xuan, Yun Lin, Xiaoniu Yang | IEEE Transactions on Reliability | 75 | 1 | 203–217 | 2026 | 9.3 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 833 | Enhancing Reliability and Performance of Deep GnG Monitoring Framework Under Low-Quality Industrial Data | ||||||||
| Zhiqiang Ge | IEEE Transactions on Reliability | 74 | 4 | 5299–5308 | 2025 | 9.3 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 834 | Study of the Reliability of the Switching-On Process of LV Relays Powered by Distorted AC Supply Source | ||||||||
| Dariusz Smugala, Pawel Albrechtowicz | IEEE Transactions on Reliability | 74 | 3 | 4185–4193 | 2025 | 9.3 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 835 | Boosting Identifier Renaming Opportunity Identification via Context-Based Deep Code Representation | ||||||||
| Jingxuan Zhang, Zhuhang Li, Jiahui Liang, Zhiqiu Huang | IEEE Transactions on Reliability | 74 | 3 | 3296–3310 | 2025 | 9.3 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 836 | Insights From Bugs in FPGA High-Level Synthesis Tools: An Empirical Study of Bambu Bugs | ||||||||
| Zun Wang, He Jiang, Xiaochen Li, Shikai Guo, Xu Zhao, Yi Zhang | IEEE Transactions on Reliability | 74 | 3 | 3341–3355 | 2025 | 9.3 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 837 | PCBSmith: An Effective Schematic Generator for Testing PCB Design Tool Chain | ||||||||
| Xu Zhao, He Jiang, Xiaochen Li, Shikai Guo, Zhilei Ren, Peiyu Zou, Huijiang Liu | IEEE Transactions on Reliability | 74 | 3 | 3281–3295 | 2025 | 9.28 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 838 | One-Class Learning-Based Contrastive Reconstruction Framework for the Anomaly Detection of Reciprocating Machinery | ||||||||
| Diego Cabrera, Jiapeng Wu, Mariela Cerrada, René-Vinicio Sánchez, Fernando Sancho, Jianyu Long, Chuan Li | IEEE Transactions on Reliability | 74 | 4 | 5465–5474 | 2025 | 9.28 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 839 | Detecting WebAssembly Runtime Bugs With Grammar-Guided Program Mutation | ||||||||
| Xinyi Lu, Zhide Zhou, Xiaochen Li, Jifeng Xuan, Hao Wu, He Jiang, Zhilei Ren | IEEE Transactions on Reliability | 74 | 4 | 5056–5069 | 2025 | 9.26 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 840 | Exploring Initiation-Growth Correlation in Accelerated Degradation Testing Data: Both Classical and Bayesian Approaches | ||||||||
| Guanqi Fang, Rong Pan, Yizi Wang, Haili He, Weiqin Yu | IEEE Transactions on Reliability | 74 | 3 | 4348–4360 | 2025 | 9.26 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||